Optoelectronic developments in speckle interferometry

被引：7

作者：

Tatam, RP ^{[1
]}

机构：

[1] CRANFIELD UNIV,SCH MECH ENGN,CTR PHOTON & OPT ENGN,OPT SENSORS GRP,CRANFIELD MK43 0AL,BEDS,ENGLAND

来源：

LASER INTERFEROMETRY VIII: TECHNIQUES AND ANALYSIS | 1996年 / 2860卷

关键词：

speckle interferometry; ESPI; shearography; laser diodes; optical fibre; shape/slope measurement; vibrations measurement;

D O I：

10.1117/12.276306

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：194 / 212

页数：19

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