Speckle interferometry: Optoelectronic developments and applications

被引:3
|
作者
Tatam, RP [1 ]
机构
[1] Cranfield Univ, Opt Sensors Grp, Ctr Photon & Opt Engn, Sch Mech Engn, Cranfield MK43 0AL, Beds, England
来源
关键词
speckle interferometry; ESPI; shearography; optical fibres; lasers;
D O I
10.1117/12.357769
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Since the initial concept of speckle interferometry was published more than 30 years ago the subject has matured to the point where it is now an engineering tool used in a wide range of applications with instrumentation available from a number of companies. The development of the technique to this level has been accomplished by making use of parallel developments in a range of technological areas. These are the laser, the PC, and the CCD camera. More recently the incorporation of optical fibre technology has also had a major impact. This paper reviews recent developments in the optoelectronic technology used in speckle interferometry instrumentation and the use made of it in a range of application areas.
引用
收藏
页码:114 / 133
页数:20
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