Coherent diffraction radiation interferometry and short bunch length measurements

被引：1

作者：

Potylitsyn, AP ^{[1
]}

机构：

[1] Tomsk Polytech Univ, Tomsk 634050, Russia

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2005年 / 227卷 / 1-2期

关键词：

diffraction radiation; electron beam diagnostics;

D O I：

10.1016/j.nimb.2004.06.017

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The promising approach to measure a length of subpicosecond electron bunch is connected with measurements of coherent diffraction radiation (CDR) spectra due to strong dependence of the spectrum shape on the bunch length sigma(z) in the wavelength region lambda similar to sigma(z) [Proceedings of the International Symposium on New Visions in Laser-Beam Interactions, Nucl. Instr. and Meth. A 455 (1) (2000)]. The spectral measurements may be carried out by using an interferometer or a polychromator. The alternative approach for similar measurements is proposed in the paper. The interference pattern from two shifted halves of a CDR target may be used for this aim. If the broadband detector measures a CDR yield around lambda(0) similar to sigma(z) then moving one half of the CDR target relative to other (parallel to beam) in the range of a few bunch lengths one can obtain the detuning curve (interferogram). The shape of detuning curve and its connection with bunch length is calculated for different detector apertures and detector waveband. The proposed technique may open the new possibility for non-invasive bunch length measurements in the subpicosecond range. (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：191 / 197

页数：7

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