Precession electron diffraction and its advantages for structural fingerprinting in the transmission electron microscope

被引：11
|
作者：
Moeck, Peter [1 ]
Rouvimov, Sergei
机构：
[1] Portland State Univ, Dept Phys, Nanocrystallog Grp, Portland, OR 97207 USA
来源：
ZEITSCHRIFT FUR KRISTALLOGRAPHIE-CRYSTALLINE MATERIALS | 2010年 / 225卷 / 2-3期
关键词：
Precession electron diffraction; Structural fingerprinting; CRYSTAL-STRUCTURE REFINEMENT; AB-INITIO DETERMINATION; X-RAY-DIFFRACTION; PLATONIC POLYHEDRA; SHAPE AMPLITUDES; INTENSITY DATA; METAL-OXIDE; IDENTIFICATION; CRYSTALLOGRAPHY; MICRODIFFRACTION;
D O I：
10.1524/zkri.2010.1162
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
The foundations of precession electron diffraction in a transmission electron microscope are outlined. A brief illustration of the fact that laboratory-based powder X-ray diffraction fingerprinting is not feasible for nanocrystals is given. A procedure for structural fingerprinting of nanocrystals on the basis of structural data that can be extracted from precession electron diffraction spot patterns is proposed.
引用
收藏
页码：110 / 124
页数：15
相关论文
共 50 条
  • [31] IDENTIFICATION OF MATERIALS BY ELECTRON DIFFRACTION IN THE ELECTRON MICROSCOPE
    MATTHEWS, HI
    WILMAN, H
    BRITISH JOURNAL OF APPLIED PHYSICS, 1955, 6 (08): : 277 - 280
  • [32] DIFFRACTION MEASUREMENTS WITH ELECTRON MICROSCOPE
    MACKAY, AL
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (09): : 907 - &
  • [33] DIFFRACTION IN A SCANNING ELECTRON MICROSCOPE
    Rihacek, T.
    Mika, F.
    Matejka, M.
    Kratky, S.
    Muellerova, I.
    RECENT TRENDS IN CHARGED PARTICLE OPTICS AND SURFACE PHYSICS INSTRUMENTATION, 2016, : 56 - 57
  • [34] Fresnel diffraction in the electron microscope
    Boersch, H
    PHYSIKALISCHE ZEITSCHRIFT, 1943, 44 : 202 - 211
  • [35] Accurate and precise lattice parameters by selected-area electron diffraction in the transmission electron microscope
    Mugnaioli, Enrico
    Capitani, Giancarlo
    Nieto, Fernando
    Mellini, Marcello
    AMERICAN MINERALOGIST, 2009, 94 (5-6) : 793 - 800
  • [36] A diffraction adapter for the electron microscope
    Hillier, J
    Baker, RF
    Zworykin, VK
    JOURNAL OF APPLIED PHYSICS, 1942, 13 (09) : 571 - 577
  • [37] How to resolve ab-initio nanostructures by electron diffraction: applications of beam precession in transmission electron microscopy
    Nicolopoulos, Stavros
    Nickolskiy, Maximilian
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2006, 62 : S52 - S52
  • [38] Transmission kikuchi diffraction in the scanning electron microscope: Orientation mapping on the nanoscale
    1600, ASM International (172):
  • [39] AN ELECTRON SPECTROMETER FOR USE WITH TRANSMISSION ELECTRON MICROSCOPE
    WITTRY, DB
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1969, 2 (12) : 1757 - &
  • [40] Angularly sensitive detector for transmission Kikuchi diffraction in a scanning electron microscope
    Jacobson, Bryce T.
    Gavryushkin, Dmitriy
    Harrison, Mark
    Woods, Kaley
    EMERGING DIGITAL MICROMIRROR DEVICE BASED SYSTEMS AND APPLICATIONS VII, 2015, 9376
12345