A diffraction adapter for the electron microscope

被引：10

|

作者：

Hillier, J ^{[1
]}

Baker, RF ^{[1
]}

Zworykin, VK ^{[1
]}

机构：

[1] RCA Mfg Co, Res Labs, Camden, NJ USA

来源：

JOURNAL OF APPLIED PHYSICS | 1942年 / 13卷 / 09期

关键词：

D O I：

10.1063/1.1714911

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：571 / 577

页数：7

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