Comparison of the Josephson voltage standards of VNIIM and PTB

被引：0
|
作者：
Behr, R [1 ]
Niemeyer, J [1 ]
Katkov, A [1 ]
机构：
[1] Phys Tech Bundesanstalt, D-38116 Braunschweig, Germany
来源：
2000 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST | 2000年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Comparisons of the 1 V Josephson array voltage standard (JAVS) of the "D. I. Mendeleyev Institute for Metrology" (VNIIM), Russia, with that of the Physikalisch-Technische Bundesanstalt (PTB), Germany, were carried out in St. Petersburg in June 1999. The results of the direct comparison agree within an overall standard uncertainty of less than 1 nV. The results also show that direct comparisons are useful for detecting voltage offsets of a few parts in 10(10).
引用
收藏
页码：251 / 252
页数：2
相关论文
共 50 条
  • [21] Comparison of Josephson array voltage standards using Zener reference standards
    Gengru, Z
    Yifei, H
    Lu, W
    Guifen, Z
    Jensen, HD
    Henderson, LCA
    Thompson, RP
    METROLOGIA, 1997, 34 (05) : 423 - 425
  • [22] Comparison of the Josephson voltage standards of the NIM (China) and the BIPM
    Reymann, D
    Xue, SQ
    Liu, RM
    Li, HH
    Gao, J
    Zhou, YQ
    Witt, TJ
    METROLOGIA, 1996, 33 (05) : 475 - 478
  • [23] Comparison of Josephson voltage standards held by the SISIR and the DFM
    Jensen, HD
    Wey, SC
    METROLOGIA, 1996, 33 (02) : 161 - 163
  • [24] COMPARISON OF JOSEPHSON SERIES-ARRAY VOLTAGE STANDARDS
    NIEMEYER, J
    GRIMM, L
    MEIER, W
    FUNCK, T
    DUNSCHEDE, FW
    AUSBUTTEL, E
    HOLTOUG, JU
    MYGIND, J
    METROLOGIA, 1990, 27 (02) : 41 - 52
  • [25] Realization of an Opto-Electronic Bias for Pulse-Driven Josephson Voltage Standards at PTB
    Herick, Jonas
    Palafox, Luis
    Bardalen, Eivind
    Bauer, Stephan
    Behr, Ralf
    Karlsen, Bjornar
    Kieler, Oliver
    Malmbekk, Helge
    2020 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS (CPEM), 2020,
  • [26] Josephson voltage standards
    Hamilton, CA
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (10): : 3611 - 3623
  • [27] The Nb-Al technology at PTB -: a common base for different types of Josephson voltage standards
    Müller, F
    Schulze, H
    Behr, R
    Kohlmann, J
    Niemeyer, J
    PHYSICA C, 2001, 354 (1-4): : 66 - 70
  • [28] Progress on the Opto-Electronic Bias for Pulse-Driven Josephson Voltage Standards at PTB
    Kraus, Marco
    Kieler, Oliver
    Behr, Ralf
    Palafox, Luis
    2024 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS, CPEM 2024, 2024,
  • [29] Josephson voltage standards
    Kohlmann, J
    Behr, R
    Funck, T
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2003, 14 (08) : 1216 - 1228
  • [30] Comparison of length standards between the CMA and the VNIIM
    Abramova, L
    Baratov, V
    Fedorin, V
    Khavinson, L
    Latigneva, E
    Riski, K
    Ikonen, E
    Lassila, A
    METROLOGIA, 1996, 33 (01) : 29 - 33
12345