Ion-induced magnetic texturing of Ni films: Domain structure and strain

被引：7
|
作者：
Zhang, K. [1 ]
Lieb, K. P.
Merkel, D. G.
Uhrmacher, M.
Pilet, N.
Ashworth, T. V.
Hug, H. J.
机构：
[1] Univ Gottingen, Inst Phys 2, D-37077 Gottingen, Germany
[2] Univ Gottingen, SFB 602, D-37077 Gottingen, Germany
[3] Univ Basel, Inst Phys, CH-4056 Basel, Switzerland
[4] EMPA, Swiss Fed Lab Mat Testing & Res, CH-8600 Dubendorf, Switzerland
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2007年 / 257卷 / 1-2 SPEC. ISS.期
关键词：
heavy ion implantation; magnetization; magnetic force microscopy;
D O I：
10.1016/j.nimb.2007.01.032
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Ion-irradiation of ferromagnetic films induces pronounced changes of their microstructure and micromagnetism. The present study is devoted to the changes in the domain structure in 65-75 nm electron-evaporated polycrystalline Ni films due to 200-keV Xe+ or 100-keV Ni+ implantation. For magnetic analysis, we combined magnetic force microscopy (MFM) and magneto-optical Kerr effect (MOKE); X-ray diffraction and Rutherford back-scattering spectroscopy served to characterize the microstructure of the films. After deposition, MFM indicated a pattern of magnetic ripples (with in-plane and perpendicular components of the magnetization). After ion irradiation, MOKE showed almost total in-plane remanence, and MFM confirmed the disappearance of the ripples at room temperature. The magnetic properties were correlated with the ion-induced changes in the strain in the as-deposited and ion-irradiated films. (c) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码：379 / 382
页数：4
相关论文
共 50 条
  • [41] The effect of surface ion-induced defects on CO adsorption on polycrystalline Ni
    S. N. Trukhan
    V. P. Ivanov
    Reaction Kinetics and Catalysis Letters, 1998, 65 : 355 - 362
  • [42] Ion-beam-induced texturing and grain growth in Ag films
    CrespoSosa, A
    Bolse, W
    Geyer, U
    Gimbel, M
    Lieb, KP
    APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY - PROCEEDINGS OF THE FOURTEENTH INTERNATIONAL CONFERENCE, PTS 1 AND 2, 1997, (392): : 945 - 948
  • [43] Swift heavy ion irradiation induced texturing in NiO thin films
    Mallick, P.
    Agarwal, D. C.
    Rath, Chandana
    Biswal, R.
    Behera, D.
    Avasthi, D. K.
    Kanjilal, D.
    Satyam, P. V.
    Mishra, N. C.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2008, 266 (14): : 3332 - 3335
  • [44] The Effect of Size and Strain on Micro Stripe Magnetic Domain Structure of CoFeB Thin Films
    Li, Hongyang
    Xie, Yali
    Yang, Huali
    Hu, Haixu
    Li, Mengchao
    Li, Run-Wei
    METALS, 2023, 13 (04)
  • [45] Novel Chiral Magnetic Domain Wall Structure in Fe/Ni/Cu(001) Films
    Chen, G.
    Zhu, J.
    Quesada, A.
    Li, J.
    N'Diaye, A. T.
    Huo, Y.
    Ma, T. P.
    Chen, Y.
    Kwon, H. Y.
    Won, C.
    Qiu, Z. Q.
    Schmid, A. K.
    Wu, Y. Z.
    PHYSICAL REVIEW LETTERS, 2013, 110 (17)
  • [46] Strain induced magnetic domain evolution and spin reorientation transition in epitaxial manganite films
    Singh, Gyanendra
    Rout, P. K.
    Porwal, Rajni
    Budhani, R. C.
    APPLIED PHYSICS LETTERS, 2012, 101 (02)
  • [47] NEW TYPE OF MAGNETIC DOMAIN STRUCTURE IN NEGATIVE MAGNETOSTRICTION NI-FE FILMS
    SAITO, N
    FUJIWARA, H
    SUGITA, Y
    JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1964, 19 (07) : 1116 - &
  • [48] Swift heavy ion-induced surface nanopatterning of indium oxide films
    Tripathi, Neeti
    Tripathi, Ambuj
    Rath, Shyama
    RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2011, 166 (8-9): : 578 - 584
  • [49] Slow ion-induced electron emission from thin insulating films
    van Emmichoven, P. A. Zeijlmans
    Matulevich, Y. T.
    SLOW HEAVY-PARTICLE INDUCED ELECTRON EMISSION FROM SOLID SURFACES, 2007, 225 : 213 - 239
  • [50] Magnetic texturing of ferromagnetic thin films by sputtering induced ripple formation
    Zhang, K.
    Uhrmacher, M.
    Hofsaess, H.
    Krauser, J.
    JOURNAL OF APPLIED PHYSICS, 2008, 103 (08)
12345