Hydrazine cyanurate as a nitrogen source for thin nitride film growth

被引:2
|
作者
Kropewnicki, TJ [1 ]
Kohl, PA [1 ]
机构
[1] Georgia Inst Technol, Sch Chem Engn, Atlanta, GA 30332 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1998年 / 16卷 / 01期
关键词
D O I
10.1116/1.580960
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The use of liquid hydrazine (N2H4) as a nitrogen source for nitridation reactions has been restricted because of safety, purity, and difficulties in using a liquid source. Hydrazine cyanurate (HC) is a stable solid complex of N2H4 which can be easily handled and purified before use and which evolves pure N2H4 upon heating, thus making it a promising source of N2H4 for nitridation reactions. In this article, a process for the synthesis of HC has been developed which decreases the H2O content of the evolved N2H4 from 10% when H2O was used as the solvent in the synthesis of HC to 0.7% by replacing H2O with dimethylsulfoxide as the solvent in the synthesis of HC. The use of the purified HC is demonstrated as a solid source in the nitridation of (100) GaAs substrates at 200 degrees C in a low pressure chemical vapor deposition reactor. The nitridated GaAs surfaces were analyzed by x-ray photoelectron spectroscopy and were found to be primarily comprised of GaN, GaAs, and Ga2O3. The ratio of the constituent peak heights in the Ga 3d peak of GaN to Ga2O3 was 2.25 in the grown nitride films. The oxide impurities were most likely due to incomplete removal of the native substrate oxide formed prior to growth and were not a product of the nitridation. (C) 1998 American Vacuum Society.
引用
收藏
页码:139 / 144
页数:6
相关论文
共 50 条
  • [31] The effect of formation of titanium nitride thin film on surface characteristics of titanium by nitrogen ion implantation
    Alipour, R.
    Khani, A. Ali
    Mohammadi, R.
    Rostami, S.
    JOURNAL OF CHEMICAL RESEARCH, 2016, (01) : 12 - 15
  • [32] NITROGEN IMPLANTATION INTO GLASSY-CARBON AS AN ATTEMPT TO GROW A CARBON NITRIDE THIN-FILM
    HOFFMAN, A
    BRENER, R
    GOUZMAN, I
    CYTERMANN, C
    GELLER, H
    LEVIN, L
    KENNY, M
    DIAMOND AND RELATED MATERIALS, 1995, 4 (04) : 292 - 296
  • [33] Effect of nitrogen flow ratio on nano-mechanical properties of tantalum nitride thin film
    Firouzabadi, S. S.
    Naderi, M.
    Dehghani, K.
    Mahboubi, F.
    JOURNAL OF ALLOYS AND COMPOUNDS, 2017, 719 : 63 - 70
  • [34] Nitrogen Emission in Reactive Magnetron Sputtering Plasmas During the Deposition of Titanium Nitride Thin Film
    Nayan, Nafarizal
    How, Soo Ren
    Lias, Jais
    Ahmad, Mohd Khairul
    Sahdan, Mohd Zainizan
    Shuhaimi, Ahmad
    INTERNATIONAL CONFERENCE ON PLASMA SCIENCE AND APPLICATIONS (ICPSA2016), 2017, 1824
  • [35] InN thin-film growth using an ECR plasma source
    Sato, Y
    Sato, S
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1995, 35 (1-3): : 171 - 175
  • [36] Characterisation of a nitrogen ECR plasma source for the MBE growth of the dilute nitride semiconductor GaAsN
    Usher, B. F.
    Warminski, T.
    Dieing, T.
    Prince, Kathryn
    SURFACE SCIENCE, 2007, 601 (24) : 5800 - 5802
  • [37] High temperature growth of the dilute nitride GaAsN using a nitrogen ECR plasma source
    Usher, Brian
    Warminski, Tadeus
    Dieing, Thomas
    Prince, Kathryn
    2006 INTERNATIONAL CONFERENCE ON NANOSCIENCE AND NANOTECHNOLOGY, VOLS 1 AND 2, 2006, : 537 - +
  • [38] Film thickness effects on the fracture of tantalum nitride on aluminum nitride thin film systems
    Moody, NR
    Medlin, D
    Boehme, D
    Norwood, DP
    ENGINEERING FRACTURE MECHANICS, 1998, 61 (01) : 107 - 118
  • [39] Dependence of GaN MOMBE growth on nitrogen source: ECR plasma gun structure and monomethyl-hydrazine
    Yaguchi, T
    Yonemura, S
    Tsuchiya, H
    Shimoyama, N
    Suemasu, T
    Hasegawa, F
    JOURNAL OF CRYSTAL GROWTH, 1998, 189 : 380 - 384
  • [40] LUBRICATION PERFORMANCE OF MELAMINE CYANURATE COMPOSITE LUBRICANT FOR THIN-FILM DISK MEDIA
    MIYAMOTO, T
    SATO, I
    ANDO, Y
    IEEE TRANSACTIONS ON MAGNETICS, 1987, 23 (05) : 2386 - 2388