共 50 条
- [41] Kelvin probe force microscopy in liquid using electrochemical force microscopy BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2015, 6 : 201 - 214
- [42] Scanning auger electron microscopy evaluation and composition control of cantilevers for ultrahigh vacuum atomic force microscopy JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1997, 36 (6B): : 3855 - 3859
- [43] Pulsed Force Kelvin Probe Force Microscopy-A New Type of Kelvin Probe Force Microscopy under Ambient Conditions JOURNAL OF PHYSICAL CHEMISTRY C, 2024, 128 (24): : 9813 - 9827
- [44] Drive-amplitude-modulation atomic force microscopy: From vacuum to liquids BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2012, 3 : 336 - 344
- [48] Observation of silicon surfaces using ultrahigh-vacuum noncontact, atomic force microscopy JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1996, 35 (5B): : L668 - L671
- [49] From contact to non-contact: Force microscopy experiments in ultrahigh vacuum. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2002, 223 : C93 - C93
- [50] Simultaneous imaging of tunneling current variation by noncontact atomic force microscopy in ultrahigh vacuum 1600, JJAP, Tokyo, Japan (39):