Dynamic behavior of amplitude detection Kelvin force microscopy in ultrahigh vacuum

被引:9
|
作者
Diesinger, H. [1 ]
Deresmes, D. [1 ]
Nys, J. -P. [1 ]
Melin, T. [1 ]
机构
[1] CNRS, IEMN, UMR 8520, F-59652 Villeneuve Dascq, France
关键词
Non-contact atomic force microscopy; (AFM); Kelvin force microscopy; SENSITIVITY; CANTILEVER;
D O I
10.1016/j.ultramic.2009.10.016
中图分类号
TH742 [显微镜];
学科分类号
摘要
The acquisition rate of all scanning probe imaging techniques with feedback control is limited by the dynamic response of the control loops. Performance criteria are the control loop bandwidth and the output signal noise power spectral density. Depending on the acceptable noise level, it may be necessary to reduce the sampling frequency below the bandwidth of the control loop. In this work, the frequency response of a vacuum Kelvin force microscope with amplitude detection (AM-KFM) using a digital signal processing (DSP) controller is characterized and optimized. Then, the main noise source and its impact on the output signal is identified. A discussion follows on how the system design can be optimized with respect to output noise. Furthermore, the interaction between Kelvin and distance control loop is studied, confirming the beneficial effect of KFM on topography artefact reduction in the frequency domain. The experimental procedure described here can be generalized to other systems and allows to locate the performance limitations. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:162 / 169
页数:8
相关论文
共 50 条
  • [41] Kelvin probe force microscopy in liquid using electrochemical force microscopy
    Collins, Liam
    Jesse, Stephen
    Kilpatrick, Jason I.
    Tselev, Alexander
    Okatan, M. Baris
    Kalinin, Sergei V.
    Rodriguez, Brian J.
    BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2015, 6 : 201 - 214
  • [42] Scanning auger electron microscopy evaluation and composition control of cantilevers for ultrahigh vacuum atomic force microscopy
    Arai, T
    Tomitori, M
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1997, 36 (6B): : 3855 - 3859
  • [43] Pulsed Force Kelvin Probe Force Microscopy-A New Type of Kelvin Probe Force Microscopy under Ambient Conditions
    Zahmatkeshsaredorahi, Amirhossein
    Jakob, Devon S.
    Xu, Xiaoji G.
    JOURNAL OF PHYSICAL CHEMISTRY C, 2024, 128 (24): : 9813 - 9827
  • [44] Drive-amplitude-modulation atomic force microscopy: From vacuum to liquids
    Jaafar, Miriam
    Martinez-Martin, David
    Cuenca, Mariano
    Melcher, John
    Raman, Arvind
    Gomez-Herrero, Julio
    BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2012, 3 : 336 - 344
  • [45] Kelvin force microscopy at the second cantilever resonance:: An out-of-vacuum crosstalk compensation setup
    Diesinger, H.
    Deresmes, D.
    Nys, J. -P.
    Melin, T.
    ULTRAMICROSCOPY, 2008, 108 (08) : 773 - 781
  • [46] Friction force microscopy in ultrahigh vacuum: an atomic-scale study on KBr(001)
    Luethi, R.
    Meyer, E.
    Howald, L.
    Bammerlin, M.
    Guentherodt, H. -J.
    Gyalog, T.
    Thomas, H.
    TRIBOLOGY LETTERS, 1995, 1 (2-3) : 129 - 138
  • [47] Few electrons injection in silicon nanocrystals probed by ultrahigh vacuum atomic force microscopy
    Decossas, S
    Vitiello, J
    Baron, T
    Mazen, F
    Gidon, S
    APPLIED PHYSICS LETTERS, 2005, 86 (03) : 1 - 3
  • [48] Observation of silicon surfaces using ultrahigh-vacuum noncontact, atomic force microscopy
    Kitamura, S
    Iwatsuki, M
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1996, 35 (5B): : L668 - L671
  • [49] From contact to non-contact: Force microscopy experiments in ultrahigh vacuum.
    Meyer, E
    Bennewitz, R
    Gnecco, E
    Pfeiffer, O
    Barwich, V
    Wetzel, A
    Baratoff, A
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2002, 223 : C93 - C93
  • [50] Simultaneous imaging of tunneling current variation by noncontact atomic force microscopy in ultrahigh vacuum
    Arai, Toyoko
    Tomitori, Masahiko
    1600, JJAP, Tokyo, Japan (39):