Dynamic behavior of amplitude detection Kelvin force microscopy in ultrahigh vacuum

被引:9
|
作者
Diesinger, H. [1 ]
Deresmes, D. [1 ]
Nys, J. -P. [1 ]
Melin, T. [1 ]
机构
[1] CNRS, IEMN, UMR 8520, F-59652 Villeneuve Dascq, France
关键词
Non-contact atomic force microscopy; (AFM); Kelvin force microscopy; SENSITIVITY; CANTILEVER;
D O I
10.1016/j.ultramic.2009.10.016
中图分类号
TH742 [显微镜];
学科分类号
摘要
The acquisition rate of all scanning probe imaging techniques with feedback control is limited by the dynamic response of the control loops. Performance criteria are the control loop bandwidth and the output signal noise power spectral density. Depending on the acceptable noise level, it may be necessary to reduce the sampling frequency below the bandwidth of the control loop. In this work, the frequency response of a vacuum Kelvin force microscope with amplitude detection (AM-KFM) using a digital signal processing (DSP) controller is characterized and optimized. Then, the main noise source and its impact on the output signal is identified. A discussion follows on how the system design can be optimized with respect to output noise. Furthermore, the interaction between Kelvin and distance control loop is studied, confirming the beneficial effect of KFM on topography artefact reduction in the frequency domain. The experimental procedure described here can be generalized to other systems and allows to locate the performance limitations. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:162 / 169
页数:8
相关论文
共 50 条
  • [1] Resolution of Kelvin probe force microscopy in ultrahigh vacuum: comparison of experiment and simulation
    Sadewasser, S
    Glatzel, T
    Shikler, R
    Rosenwaks, Y
    Lux-Steiner, MC
    APPLIED SURFACE SCIENCE, 2003, 210 (1-2) : 32 - 36
  • [2] Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces
    Sommerhalter, C
    Glatzel, T
    Matthes, TW
    Jäger-Waldau, A
    Lux-Steiner, MC
    APPLIED SURFACE SCIENCE, 2000, 157 (04) : 263 - 268
  • [3] Amplitude or frequency modulation-detection in Kelvin probe force microscopy
    Glatzel, T
    Sadewasser, S
    Lux-Steiner, MC
    APPLIED SURFACE SCIENCE, 2003, 210 (1-2) : 84 - 89
  • [4] Signal amplitude and sensitivity of the Kelvin probe force microscopy
    Ouisse, T
    Martins, F
    Stark, M
    Huant, S
    Chevrier, J
    APPLIED PHYSICS LETTERS, 2006, 88 (04) : 1 - 3
  • [5] Force microscopy experiments in ultrahigh vacuum.
    Meyer, E
    Bennewitz, R
    Bammerlin, M
    Guggisberg, M
    Loppacher, C
    Barwich, V
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1999, 217 : U626 - U626
  • [6] CuGaSe2 solar cell cross section studied by Kelvin probe force microscopy in ultrahigh vacuum
    Glatzel, T
    Marrón, DF
    Schedel-Niedrig, T
    Sadewasser, S
    Lux-Steiner, MC
    APPLIED PHYSICS LETTERS, 2002, 81 (11) : 2017 - 2019
  • [7] Magnetostatic interaction studied by force microscopy in ultrahigh vacuum
    Wadas, A
    Dreyer, M
    Lohndorf, M
    Wiesendanger, R
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1997, 64 (04): : 353 - 355
  • [8] ATOMIC-FORCE MICROSCOPY IN ULTRAHIGH-VACUUM
    GIESSIBL, FJ
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (6B): : 3726 - 3734
  • [9] Magnetostatic interaction studied by force microscopy in ultrahigh vacuum
    A. Wadas
    M. Dreyer
    M. Löhndorf
    R. Wiesendanger
    Applied Physics A, 1997, 64 : 353 - 355
  • [10] Surface photovoltage spectroscopy in a Kelvin probe force microscope under ultrahigh vacuum
    Streicher, F.
    Sadewasser, S.
    Lux-Steiner, M. Ch.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2009, 80 (01):