Statistical patterns: an approach for high-speed and high-accuracy shape measurements

被引：9

作者：

Schaffer, Martin ^{[1
]}

Grosse, Marcus ^{[1
]}

Harendt, Bastian ^{[2
]}

Kowarschik, Richard ^{[2
]}

机构：

[1] Univ Jena, EnShape Startup, D-07743 Jena, Germany

[2] Univ Jena, Abbe Ctr Photon, Inst Appl Opt, D-07743 Jena, Germany

来源：

OPTICAL ENGINEERING | 2014年 / 53卷 / 11期

关键词：

profilometry; shape measurement; fringe projection; statistical patterns; stereo photogrammetry; optical metrology; stereo vision; speckle; SPACETIME STEREO; UNIFYING FRAMEWORK; FRINGE PROJECTION; HIGH-RESOLUTION; 3D MEASUREMENT; DEPTH;

D O I：

10.1117/1.OE.53.11.112205

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Statistical patterns have been used for structured illumination within a stereo-photogrammetry setup to precisely measure the shape of nearly arbitrary objects in a short time. This contribution gives an overview of recently developed projection setups based on such statistical patterns. Coherent and incoherent approaches as well as the applied reconstruction algorithm are explained. The results show the suitability of the statistical pattern projection approach to replace the commonly used slow digital light processing (DLP) projectors of three-dimensional shape sensors and facilitate measurements in an ultrashort time frame (microsecond range), e.g., to track moving objects. (C) 2014 Society of Photo-Optical Instrumentation Engineers (SPIE)

引用

页数：8

共 50 条

[1] High-speed, high-accuracy optical measurements of polycrystalline silicon for process control
Benson, TE
Ramamoorthy, A
Kamlet, LI
Terry, FL
[J]. THIN SOLID FILMS, 1998, 313 : 435 - 441
[2] High-speed, high-accuracy optical measurements of polycrystalline silicon for process control
Benson, Tyrone E.
Ramamoorthy, Arun
Kamlet, Leonard I.
Terry Jr., Fred L.
[J]. Thin Solid Films, 1998, 313-314 (1-2): : 435 - 441
[3] HIGH-ACCURACY HIGH-SPEED ANALOG DIGITAL CONVERTER
SOLODIMOV, AA
POLUBABKIN, YV
[J]. INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1986, 29 (02) : 381 - 384
[4] Adjustment computation of HASM: a high-accuracy and high-speed method
Yue, T. X.
Wang, S. H.
[J]. INTERNATIONAL JOURNAL OF GEOGRAPHICAL INFORMATION SCIENCE, 2010, 24 (11) : 1725 - 1743
[5] High-accuracy, high-speed, and smart metrology in the EUV era
Wang Zhigang
Kei, Sakai
Yasushi, Ebizuka
[J]. METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXXIV, 2020, 11325
[6] High-speed and high-accuracy plunge cutting for vertical walls
Wakaoka, S
Yamane, Y
Sekiya, K
Narutaki, N
[J]. JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, 2002, 127 (02) : 246 - 250
[7] Development of a High-speed, High-accuracy Robot Hand for Micromanipulation
Sato, Hiroshi
Yamakawa, Yuji
Senoo, Taku
Ishikawa, Masatoshi
[J]. 2016 IEEE INTERNATIONAL CONFERENCE ON ROBOTICS AND BIOMIMETICS (ROBIO), 2016, : 1535 - 1541
[8] High-speed and high-accuracy volume holographic optical correlator
Yi, Yao
Cao, Liangcai
Zheng, Tianxiang
Zhao, Tian
He, Qingsheng
Jin, Guofan
[J]. Zhongguo Jiguang/Chinese Journal of Lasers, 2014, 41 (02):
[9] ON THE ACQUISITION AND MAINTENANCE OF HIGH-SPEED AND HIGH-ACCURACY IN A KEYBOARD TASK
LEONARD, JA
NEWMAN, RC
[J]. ERGONOMICS, 1965, 8 (1-4) : 281 - 304
[10] High-speed, high-accuracy measuring system inspects automotive parts
不详
[J]. MODERN PLASTICS, 1997, 74 (12): : 97 - 97

← 1 2 3 4 5 →