Statistical patterns: an approach for high-speed and high-accuracy shape measurements

被引：9

作者：

Schaffer, Martin ^{[1
]}

Grosse, Marcus ^{[1
]}

Harendt, Bastian ^{[2
]}

Kowarschik, Richard ^{[2
]}

机构：

[1] Univ Jena, EnShape Startup, D-07743 Jena, Germany

[2] Univ Jena, Abbe Ctr Photon, Inst Appl Opt, D-07743 Jena, Germany

来源：

OPTICAL ENGINEERING | 2014年 / 53卷 / 11期

关键词：

profilometry; shape measurement; fringe projection; statistical patterns; stereo photogrammetry; optical metrology; stereo vision; speckle; SPACETIME STEREO; UNIFYING FRAMEWORK; FRINGE PROJECTION; HIGH-RESOLUTION; 3D MEASUREMENT; DEPTH;

D O I：

10.1117/1.OE.53.11.112205

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Statistical patterns have been used for structured illumination within a stereo-photogrammetry setup to precisely measure the shape of nearly arbitrary objects in a short time. This contribution gives an overview of recently developed projection setups based on such statistical patterns. Coherent and incoherent approaches as well as the applied reconstruction algorithm are explained. The results show the suitability of the statistical pattern projection approach to replace the commonly used slow digital light processing (DLP) projectors of three-dimensional shape sensors and facilitate measurements in an ultrashort time frame (microsecond range), e.g., to track moving objects. (C) 2014 Society of Photo-Optical Instrumentation Engineers (SPIE)

引用

页数：8

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