On the intrinsic origin of 1/f noise

被引：27
|
作者：
Kaulakys, B
机构：
[1] Inst Theoret Phys & Astrophys, LT-2600 Vilnius, Lithuania
[2] Vilnius State Univ, Dept Phys, LT-2040 Vilnius, Lithuania
来源：
MICROELECTRONICS RELIABILITY | 2000年 / 40卷 / 11期
关键词：
Long-memory process;
D O I：
10.1016/S0026-2714(00)00055-X
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The problem of the intrinsic origin of 1/f noise is considered. Currents and signals consisting of a sequence of pulses are analyzed. It is shown that the intrinsic origin of 1/f noise is a random walk of the average time between subsequent pulses of the pulse sequence, or the interevent time. This results in the long-memory process for the pulse occurrence time and in 1/f type power spectrum of the signal. (C) 2000 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码：1787 / 1790
页数：4
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