On the intrinsic origin of 1/f noise

被引：27

作者：

Kaulakys, B

机构：

[1] Inst Theoret Phys & Astrophys, LT-2600 Vilnius, Lithuania

[2] Vilnius State Univ, Dept Phys, LT-2040 Vilnius, Lithuania

来源：

MICROELECTRONICS RELIABILITY | 2000年 / 40卷 / 11期

关键词：

Long-memory process;

D O I：

10.1016/S0026-2714(00)00055-X

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The problem of the intrinsic origin of 1/f noise is considered. Currents and signals consisting of a sequence of pulses are analyzed. It is shown that the intrinsic origin of 1/f noise is a random walk of the average time between subsequent pulses of the pulse sequence, or the interevent time. This results in the long-memory process for the pulse occurrence time and in 1/f type power spectrum of the signal. (C) 2000 Elsevier Science Ltd. All rights reserved.

引用

页码：1787 / 1790

页数：4

共 50 条

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