Effect of Electrode-Thickness on Electrical Properties of Organic-Thin-Film-Transistors

被引:0
|
作者
Pal, Ashish [1 ]
Kumar, Brijesh [1 ]
Tripathi, G. S. [1 ]
机构
[1] Madan Mohan Malaviya Univ Technol, Dept Elect & Commun Engn, Gorakhpur 273010, Uttar Pradesh, India
关键词
Bottom-gate with contact electrodes at bottom and top; Drive current; Organic material based transistor; Performance parameter;
D O I
暂无
中图分类号
TN [电子技术、通信技术];
学科分类号
0809 ;
摘要
In this paper the impact of the source/drain (S/D) electrode on performance parameters of the organic-material based transistor is discussed using the 2-D numerical-device Atlas simulator. Additionally, the performance-parameter and the electrical-characteristics of transistor is evaluated in terms of the drive-current, mobility and current on-off-ratio. Furthermore, thickness of source/drain electrode is varied to analyze the impact on performance parameters of the transistor in the range of infinitesimal-thickness to 40 nm with 10 nm step size in both the configurations, bottom-gate with contact electrodes at bottom and top-configurations. These configurations are also termed as planar and staggered-OTFT configurations, respectively. On the basis of result analysis, it is found that BGBC configuration have lower drive current in comparison to bottom gate top contact configuration because of larger barrier heights. Subsequently, it is also analyze that BGBC configuration has more impact on their performance parameters in comparison to BGTC configuration with variation in electrode thickness. At the outset, it is observe that thickness of source-drain electrodes has the significant impact on the device performance, therefore, due consideration is needed during performance analysis and actual fabrication of the organic material based transistors.
引用
收藏
页数:5
相关论文
共 50 条
  • [31] Novel electrode architecture for transparent organic thin-film transistors
    Chen, Fang-Chung
    Chen, Tung-Hsien
    Lin, Yung-Sheng
    IMID/IDMC 2006: THE 6TH INTERNATIONAL MEETING ON INFORMATION DISPLAY/THE 5TH INTERNATIONAL DISPLAY MANUFACTURING CONFERENCE, DIGEST OF TECHNICAL PAPERS, 2006, : 194 - 197
  • [32] Organic thin film transistors with indium tin oxide bottom electrode
    Han, Chang-Wook
    Shin, Hee-Sun
    Park, Joong-Hyun
    Han, Min-Koo
    Pang, Hee-Suk
    Kim, Ki-Yong
    Chung, In-Jae
    Pyo, Sang-Woo
    Lee, Dong-Hyun
    Kim, Young-Kwan
    PHYSICA SCRIPTA, 2006, T126 : 41 - 44
  • [33] Effect of the electrode structure on the electrical properties of alkoxide derived ferroelectric thin film
    Ohno, Tomoya
    Matsuda, Takeshi
    Nukina, Takero
    Sakamoto, Naonori
    Wakiya, Naoki
    Tokuda, Shou
    Suzuki, Hisao
    MATERIALS LETTERS, 2010, 64 (15) : 1742 - 1744
  • [34] Effect of Microstructure on Electrical Properties of Thin Film Alumina Capacitor with Metal Electrode
    Jeong, Myung-Sun
    Ju, Byeong-Kwon
    Oh, Young-Jei
    Lee, Jeon-Kook
    KOREAN JOURNAL OF MATERIALS RESEARCH, 2011, 21 (06): : 309 - 313
  • [35] Impact of film thickness of organic semiconductor on off-state current of organic thin film transistors
    Islam, M. Nurul
    JOURNAL OF APPLIED PHYSICS, 2011, 110 (11)
  • [36] Influence of lithium doping on the electrical properties and ageing effect of ZnSnO thin film transistors
    Cho, In-Hwan
    Park, Hai-Woong
    Chung, Kwun-Bum
    Kim, Chan-Joong
    Jun, Byung-Hyuk
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2018, 33 (08)
  • [37] Effect of photochemical hydrogen doping on the electrical properties of ZnO thin-film transistors
    Kim, Chan Young
    Park, Ju Hyun
    Kim, Tae Geun
    JOURNAL OF ALLOYS AND COMPOUNDS, 2018, 732 : 300 - 305
  • [38] Organic thin film transistors
    Reese, Colin
    Roberts, Mark
    Ling, Mang-mang
    Bao, Zhenan
    MATERIALS TODAY, 2004, 7 (09) : 20 - 27
  • [39] Effect of hafnium addition on the electrical properties of indium zinc oxide thin film transistors
    Son, Dae-Ho
    Kim, Dae-Hwan
    Kim, Jung-Hye
    Sung, Shi-Joon
    Jung, Eun-Ae
    Kang, Jin-Kyu
    THIN SOLID FILMS, 2011, 519 (20) : 6815 - 6819
  • [40] Effect of Mesa Structure Formation on the Electrical Properties of Zinc Oxide Thin Film Transistors
    Singh, Shaivalini
    Chakrabarti, P.
    JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2014, 14 (05) : 3552 - 3556