Enhanced high resistivity SOI wafers for RF applications

被引：10
|
作者：
Lederer, D [1 ]
Lobet, R [1 ]
Raskin, JP [1 ]
机构：
[1] Catholic Univ Louvain, Microwave Lab, B-1348 Louvain, Belgium
来源：
2004 IEEE INTERNATIONAL SOI CONFERENCE, PROCEEDINGS | 2004年
关键词：
D O I：
10.1109/SOI.2004.1391549
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：46 / 47
页数：2
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