RF SOI CMOS Technology on Commercial Trap-Rich High Resistivity SOI Wafer

被引：0
|
作者：
Ben Ali, K. [1 ]
Neve, C. Roda [1 ]
Gharsallah, A. [1 ]
Raskin, J-P. [1 ]
机构：
[1] Catholic Univ Louvain, Inst Informat & Commun Technol Elect & Appl Math, B-1348 Louvain, Belgium
来源：
IEEE INTERNATIONAL SOI CONFERENCE | 2012年
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页数：2
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