Power Management of Monolithic 3D Manycore Chips with Inter-tier Process Variations

被引:3
|
作者
Chatterjee, Anwesha [1 ]
Musavvir, Shouvik [1 ]
Kim, Ryan Gary [2 ]
Doppa, Janardhan Rao [1 ]
Pande, Partha Pratim [1 ]
机构
[1] Washington State Univ, 355 NE Spokane St, Pullman, WA 99163 USA
[2] Colorado State Univ, 1373 Campus Delivery, Ft Collins, CO 80524 USA
基金
美国国家科学基金会;
关键词
Monolithic; 3D; MIV; imitation learning; DVFI; inter-tier process variation; EDP; TECHNOLOGY; PERFORMANCE; INTEGRATION; NOC; ICS;
D O I
10.1145/3430765
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Voltage/frequency island (VFI)-based power management is a popular methodology for designing energy-efficient manycore architectures without incurring significant performance overhead. However, monolithic 3D (M3D) integration has emerged as an enabling technology to design high-performance and energy-efficient circuits and systems. The smaller dimension of vertical monolithic inter-tier vias (MIVs) lowers effective wirelength and allows high integration density. However, sequential fabrication of M3D layers introduces inter-tier process variations that affect the performance of transistors and interconnects in different layers. Therefore, VFI-based power management in M3D manycore systems requires the consideration of inter-tier process variation effects. In this work, we present the design of an imitation learning (IL)-enabled VFI-based power-management strategy that considers the inter-tier process-variation effects in M3D manycore chips. We demonstrate that the IL-based power-management strategy can be fine-tuned based on the M3D characteristics. Our policy generates suitable V/F levels based on the computation and communication characteristics of the system for both process-oblivious and process-aware configurations. We show that the proposed process-variation-aware IL-based VFI implementation for M3D manycore chips lowers the overall energy-delay-product (EDP) by up to 16.2% on average compared to an ideal M3D system with no M3D process variations.
引用
收藏
页数:19
相关论文
共 50 条
  • [1] Electrical Modeling and Analysis of 3D Neuromorphic IC with Monolithic Inter-tier Vias
    An, Hongyu
    Ehsan, M. Amimul
    Zhou, Zhen
    Yi, Yang
    2016 IEEE 25TH CONFERENCE ON ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING AND SYSTEMS (EPEPS), 2016, : 87 - 89
  • [2] Impact of Temperature on Structure Deformation for Monolithic Inter-Tier vias In Monolithic 3D IC Packaging System
    Deepthi, Gurijala
    Kumar, Mekala Girish
    Tatineni, Madhavi
    ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, 2021, 10 (11)
  • [3] Power-Performance Study of Block-Level Monolithic 3D-ICs Considering Inter-Tier Performance Variations
    Panth, Shreepad
    Samadi, Kambiz
    Du, Yang
    Lim, Sung Kyu
    2014 51ST ACM/EDAC/IEEE DESIGN AUTOMATION CONFERENCE (DAC), 2014,
  • [4] Fault Diagnosis for Resistive Random-Access Memory and Monolithic Inter-tier Vias in Monolithic 3D Integration
    Hung, Shao-Chun
    Chaudhuri, Arjun
    Banerjee, Sanmitra
    Chakrabarty, Krishnendu
    2022 IEEE INTERNATIONAL TEST CONFERENCE (ITC), 2022, : 118 - 127
  • [5] Wireless Interconnects for Inter-tier Communication on 3D ICs
    More, Ankit
    Taskin, Baris
    40TH EUROPEAN MICROWAVE CONFERENCE, 2010, : 105 - 108
  • [6] Inter-Tier Process-Variation-Aware Monolithic 3-D NoC Design Space Exploration
    Musavvir, Shouvik
    Chatterjee, Anwesha
    Kim, Ryan Gary
    Kim, Dae Hyun
    Pande, Partha Pratim
    IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2020, 28 (03) : 686 - 699
  • [7] Invited: Efficient System Architecture in the Era of Monolithic 3D: Dynamic Inter-tier Interconnect and Processing-in-Memory
    Stow, Dylan
    Akgun, Itir
    Huangfu, Wenqin
    Xie, Yuan
    Li, Xueqi
    Loh, Gabriel H.
    PROCEEDINGS OF THE 2019 56TH ACM/EDAC/IEEE DESIGN AUTOMATION CONFERENCE (DAC), 2019,
  • [8] Inter-tier Dynamic Coupling and RF Crosstalk in 3D Sequential Integration
    Sideris, P.
    Lugo-Alvarez, J.
    Batude, P.
    Brunet, L.
    Acosta-Alba, P.
    Kerdiles, S.
    Fenouillet-Beranger, C.
    Sicard, G.
    Rozeau, O.
    Andrieu, F.
    Colinge, J-P.
    Ghibaudo, G.
    Theodorou, C.
    2019 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), 2019,
  • [9] Fault Diagnosis for Resistive Random Access Memory and Monolithic Inter-Tier Vias in Monolithic 3-D Integration
    Hung, Shao-Chun
    Chaudhuri, Arjun
    Banerjee, Sanmitra
    Chakrabarty, Krishnendu
    IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2024, 32 (07) : 1336 - 1349
  • [10] A 3D UAV-Assisted Cellular Network Model with Inter-Tier Dependence
    Deng, Na
    Chen, Libo
    Wei, Haichao
    2021 IEEE WIRELESS COMMUNICATIONS AND NETWORKING CONFERENCE (WCNC), 2021,