Boundary scan test standards

被引：1
|
作者：
Ashenden, PJ [1 ]
机构：
[1] Ashenden Designs, Design Automat Stand Comm, Stirling, SA 5152, Australia
来源：
IEEE DESIGN & TEST OF COMPUTERS | 2003年 / 20卷 / 01期
关键词：
D O I：
10.1109/MDT.2003.1189240
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：91 / 92
页数：2
相关论文
共 50 条
  • [21] Boundary Scan Test Solution for MorPACK Platform
    Huang, Chun-Ming
    Yang, Chih-Chyau
    Wu, Chien-Ming
    Lin, Chih-Hsing
    Chiu, Chun-Chieh
    Liu, Yi-Jun
    Chu, Chun-Chieh
    Lin, Chun-Ping
    Chien, Wei-De
    IEEE INTERNATIONAL SYMPOSIUM ON INTELLIGENT SIGNAL PROCESSING AND COMMUNICATIONS SYSTEMS (ISPACS 2012), 2012,
  • [22] A novel boundary scan test generation algorithm
    Ren, ZP
    Niu, CP
    Ding, SY
    Niu, HJ
    ICEMI 2005: Conference Proceedings of the Seventh International Conference on Electronic Measurement & Instruments, Vol 8, 2005, : 190 - 194
  • [23] Boundary scan as a test solution in microelectronics curricula
    Rucinski, A
    Dziurla-Rucinska, B
    FIRST IEEE INTERNATION WORKSHOP ON ELECTRONIC DESIGN, TEST AND APPLICATIONS, PROCEEDINGS, 2002, : 214 - 218
  • [24] Test-Mode-Only Scan Attack Using the Boundary Scan Chain
    Ali, Sk Subidh
    Sinanoglu, Ozgur
    Karri, Ramesh
    2014 19TH IEEE EUROPEAN TEST SYMPOSIUM (ETS 2014), 2014,
  • [25] An Approach to Generating Test Data Sequences of Boundary Scan Test System
    Deng Xiaopeng
    Xu Simao
    Zhang Yong
    PROCEEDINGS OF 2013 IEEE 11TH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS (ICEMI), 2013, : 264 - 270
  • [26] BoardFix - An in-circuit test and boundary-scan test system
    Xiao, TJ
    Zhang, HC
    Hu, LA
    ICEMI 2005: Conference Proceedings of the Seventh International Conference on Electronic Measurement & Instruments, Vol 2, 2005, : 105 - 110
  • [27] Efficient test architecture based on boundary scan for comprehensive system test
    Chakraborty, TJ
    14TH ASIAN TEST SYMPOSIUM, PROCEEDINGS, 2005, : 464 - 464
  • [28] Design of boundary scan master based on PCB test
    Zhang, SJ
    Lan, ZW
    ICEMI 2005: CONFERENCE PROCEEDINGS OF THE SEVENTH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS, VOL 2, 2005, : 57 - 59
  • [29] Extending boundary-scan technology to PCB test
    Lei, Y
    Chen, GJ
    Zhu, HG
    Xie, YL
    ICEMI 2005: Conference Proceedings of the Seventh International Conference on Electronic Measurement & Instruments, Vol 1, 2005, : 58 - 62
  • [30] TEST OF BOARD-LEVEL BOUNDARY SCAN INTEGRITY
    臧春华
    Transactions of Nanjing University of Aeronautics & Astronau, 1998, (02) : 121 - 127
12345