Fabrication of high-aspect-ratio InP-based vertical-cavity laser mirrors using CH4/H2/O2/Ar reactive ion etching

被引:17
|
作者
Schramm, JE [1 ]
Babic, DI
Hu, EL
Bowers, JE
Merz, JL
机构
[1] AMP Inc, Harrisburg, PA 17105 USA
[2] Hewlett Packard Labs, Palo Alto, CA 94303 USA
[3] Univ Calif Santa Barbara, Dept Elect & Comp Engn, Santa Barbara, CA 93106 USA
[4] Univ Notre Dame, Dept Elect Engn, South Bend, IN 46556 USA
来源
关键词
D O I
10.1116/1.589219
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The addition of oxygen to methane/hydrogen/argon reactive ion etching (RIE) processes mitigate polymer deposition, and produce vertical etched sidewalls, This work contrasts the various ways in which the oxygen may be incorporated into methane/hydrogen/argon reactive ion etching of deep(>5 mu m) InGaAsP/InP multilayers. Three methods are investigated: a "continuous" process in which a fixed amount of oxygen is added to methane/hydrogen/argon for the duration of the etch, a "cyclical" process in which the methane/hydrogen/argon RIE processes alternates with oxygen RIE, and a hybrid process which incorporates the advantages of both former methods. These processes are applied to the fabrication of tall (>10 mu m) InGaAsP/InP quarter-wave mirrors for long-wavelength vertical-cavity lasers; the various benefits and limitations of the various approaches are discussed. It is found that the hybrid process allows formation of deeply etched structures (15 mu m) with vertical profiles. (C) 1997 American Vacuum Society.
引用
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页码:2031 / 2036
页数:6
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