Reflection of X rays from a multilayer nanostructure deformed by a surface acoustic wave

被引：0

作者：

Andreev, AV ^{[1
]}

Prudnikov, IR ^{[1
]}

机构：

[1] Moscow MV Lomonosov State Univ, Moscow, Russia

来源：

RUSSIAN ULTRASONICS | 1999年 / 29卷 / 06期

关键词：

D O I：

暂无

中图分类号：

O42 [声学];

学科分类号：

070206 ; 082403 ;

摘要：

Using the method of recurrence relations, a numerical modelling is made of the reflection of X rays incident at glancing angles on a multilayer nanostructure distorted by a surface ultrasonic wave. The dependence of the intensities of the satellites on the glancing angle of the primary wave, the amplitude of the ultrasound and the order of the Bragg reflection is studied. A comparison is made of the satellite intensities calculated both in the framework of the Born approximation and by means of an exact calculation based on the recurrence relations.

引用

页码：297 / 309

页数：13

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