Diffraction reflection of a focused X-ray wave by a multilayer crystal

The Bragg diffraction of a narrow X-ray beam in a multilayer crystal is studied in the reflection geometry. It is shown by computer simulation of the experiment that strong integrated kinematic reflection occurs at any boundary of a multilayer crystal at the point of intersection of a narrow beam with the boundary. In contrast to the dynamic diffraction of a plane wave, attenuation of a narrow incident beam due to the reflection is small in comparison with the conventional absorption. As an example of a multilayer crystal, a Fabry-Perot interferometer is considered, which consists of two 70-μm-thick crystal Si layers separated by a 100-μm-thick air layer. The 12 4 0 reflection is studied at a photon energy of 15 keV. Three methods of formation of a narrow beam are considered: wavefront limitation by a slit, focusing with a parabolic lens, and focusing with a zone plate. It is shown that, for a local analysis of the thickness of layers and scattering parameters, the method of parabolic lens focusing has some advantages in comparison with the other methods.