Analysis of Digital Bang-Bang Clock and Data Recovery for Multi-Gigabit/s Serial Transceivers

被引：0
|
作者：
Sun, Yehui [1 ]
Wang, Hui [1 ]
机构：
[1] Integrated Device Technol, Shanghai 200233, Peoples R China
来源：
PROCEEDINGS OF THE IEEE 2009 CUSTOM INTEGRATED CIRCUITS CONFERENCE | 2009年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A Harmonic Balance method for analyzing digital bang-bang clock and data recovery (CDR) is proposed in this paper. The jitter tolerance performance of the CDR is predicted by a function with variables that can be easily correlated to design parameters. A 6.25Gb/s serial transceiver was fabricated in 90nm CMOS technology. Measurements show that the jitter tolerance performance can be accurately predicted by the proposed method.
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页码：343 / 346
页数：4
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