Analysis of Promising Copper Wire Bonding in Assembly Consideration

被引:0
|
作者
Wang, Mu-Chun [1 ,2 ]
Hsieh, Zhen-Ying [2 ]
Huang, Kuo-Shu [1 ]
Liu, Chuan-Hsi [3 ]
Lin, Chii-Ruey [2 ]
机构
[1] Ming Hsin Univ Sci & Technol, Dept & Inst Elect Engn, Hsinchu, Taiwan
[2] Natl Taipei Univ Technol, Grad Inst Mech Engn, Taipei, Taiwan
[3] Natl Taiwan Normal Univ, Dept Mech Engn, Tainan, Taiwan
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Although gold wire proposes the good characteristics such as malleability and stabilization, in the cost consideration to promote the package competition, the copper wire provides the better attraction. Therefore, the assembly houses gradually impress on the copper wire bonding technology desirably replacing the traditional gold wire bonding, especially in high-pin-count package. Besides the cost superiority, the electrical resistivity of copper, 1.7 mu Omega-cm, is lower than that of gold, 2.2 mu Omega-cm, and aluminum, 2.65 mu Omega-cm. Furthermore, the mechanical characteristics of copper, such as Youngs modulus and rigidity modulus (130 GPa and 48 GPa, respectively), are larger than those of gold (78 GPa and 27 GPa, respectively). In copper wire bonding, the wire ball on pad demonstrates the excellent neck intensity and the arc shape of the copper wire is more stable. This superiority in molding process is singularly and significantly noticeable.
引用
收藏
页码:96 / +
页数:2
相关论文
共 50 条
  • [21] Nanoindentation Investigation of Copper Bonding Wire and Ball
    Fan, Xiangquan
    Qian, Kaiyou
    Wang, Techun
    Cong, Yuqi
    Zhao, Mike
    Zhang, Binhai
    Wang, Jiaji
    [J]. 2009 INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING (ICEPT-HDP 2009), 2009, : 710 - +
  • [22] Alloyed Copper Bonding Wire with Homogeneous Microstructure
    Murali, S.
    Yeung, Johnny
    Perez, Roman
    [J]. 2012 35TH IEEE/CPMT INTERNATIONAL ELECTRONICS MANUFACTURING TECHNOLOGY SYMPOSIUM (IEMT), 2012,
  • [23] Cratering on thermosonic copper wire ball bonding
    Tan Chee Wei
    Abdul Razak Daud
    [J]. Journal of Materials Engineering and Performance, 2002, 11 : 283 - 287
  • [24] The process optimization of EFO for copper wire bonding
    Zhang, Wei
    Lv, Xiaorui
    Wang, Chunqing
    [J]. ADVANCED COMPOSITE MATERIALS, PTS 1-3, 2012, 482-484 : 763 - +
  • [25] SPECIAL ISSUE COPPER WIRE BONDING Preface
    Harman, George G.
    [J]. MICROELECTRONICS RELIABILITY, 2011, 51 (01) : 3 - 3
  • [26] Copper Wire Bonding - Elimination of Pad Peel
    Tan, C. E.
    Pan, Y. J.
    Cheok, T. K.
    [J]. PROCEEDINGS OF THE 2016 IEEE 18TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE (EPTC), 2016, : 129 - 134
  • [27] Copper Wire Bonding Concerns and Best Practices
    Chauhan, Preeti
    Zhong, Z. W.
    Pecht, Michael
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2013, 42 (08) : 2415 - 2434
  • [28] Cratering on thermosonic copper wire ball bonding
    Wei, TC
    Daud, AR
    [J]. JOURNAL OF MATERIALS ENGINEERING AND PERFORMANCE, 2002, 11 (03) : 283 - 287
  • [29] THERMOSONIC GOLD WIRE BONDING TO COPPER CONDUCTORS
    PITT, VA
    NEEDES, CRS
    [J]. IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY, 1982, 5 (04): : 435 - 440
  • [30] Copper Wire Bonding in High Volume Manufacturing
    Appelt, Bernd K.
    Tseng, Andy
    Lai, Yi-Shao
    Chen, Chun-Hsiung
    [J]. CHINA SEMICONDUCTOR TECHNOLOGY INTERNATIONAL CONFERENCE 2011 (CSTIC 2011), 2011, 34 (01): : 857 - 864