Quartz crystal thin-film monitoring forges ahead

被引：0
|
作者：
Grimshaw, S [1 ]
机构：
[1] Cold Springs R&D Inc, Syracuse, NY USA
来源：
PHOTONICS SPECTRA | 2003年 / 37卷 / 04期
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D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
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页码：82 / +
页数：4
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