Quartz crystal thin-film monitoring forges ahead

被引：0

作者：

Grimshaw, S ^{[1
]}

机构：

[1] Cold Springs R&D Inc, Syracuse, NY USA

来源：

PHOTONICS SPECTRA | 2003年 / 37卷 / 04期

关键词：

D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：82 / +

页数：4

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