A compact built-in current sensor for IDDQ testing

被引：3
|
作者：
Tsiatouhas, Y [1 ]
Haniotakis, T [1 ]
Nikolos, D [1 ]
机构：
[1] Univ Patras, Dept Comp Engn & Informat, Patras 26500, Greece
来源：
6TH IEEE INTERNATIONAL ON-LINE TESTING WORKSHOP, PROCEEDINGS | 2000年
关键词：
design for testability - DFT; built in current sensors - BICS; I-DDQ testing; current monitoring; bridging and stuck-on fault testability;
D O I：
10.1109/OLT.2000.856619
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
In this paper a simple to implement, compact, build-in current sensor for I-DDQ testing of CMOS VLSI circuits based on cut-rent mirroring techniques is proposed. This sensor can attain small detection times and can be used for both on-line and off-line I-DDQ testing.
引用
收藏
页码：95 / 99
页数：5
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