A compact built-in current sensor for IDDQ testing

被引：3

作者：

Tsiatouhas, Y ^{[1
]}

Haniotakis, T ^{[1
]}

Nikolos, D ^{[1
]}

机构：

[1] Univ Patras, Dept Comp Engn & Informat, Patras 26500, Greece

来源：

6TH IEEE INTERNATIONAL ON-LINE TESTING WORKSHOP, PROCEEDINGS | 2000年

关键词：

design for testability - DFT; built in current sensors - BICS; I-DDQ testing; current monitoring; bridging and stuck-on fault testability;

D O I：

10.1109/OLT.2000.856619

中图分类号：

TP39 [计算机的应用];

学科分类号：

081203 ; 0835 ;

摘要：

In this paper a simple to implement, compact, build-in current sensor for I-DDQ testing of CMOS VLSI circuits based on cut-rent mirroring techniques is proposed. This sensor can attain small detection times and can be used for both on-line and off-line I-DDQ testing.

引用

页码：95 / 99

页数：5

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