Overcoming erase/write-endurance limitations in EEPROMs

被引：0
|
作者：
Buitenkant, P
机构：
[1] Queens College, New York, NY, United States
[2] Columbia University, New York, NY, United States
[3] Brooklyn Polytechnical Institute, New York, NY, United States
来源：
EDN | 2000年 / 45卷 / 20期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
2
引用
收藏
页码：95 / +
页数：3
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