Semiconductor laser confocal and interference microscopy

被引：0
|
作者：
Wilson, T [1 ]
Juskaitis, R [1 ]
Rea, NP [1 ]
机构：
[1] UNIV OXFORD,DEPT ENGN SCI,OXFORD OX1 3PJ,ENGLAND
来源：
THREE-DIMENSIONAL MICROSCOPY: IMAGE ACQUISITION AND PROCESSING III | 1996年 / 2655卷
关键词：
D O I：
10.1117/12.237463
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：86 / 91
页数：6
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