Simulation of tip-sample interaction in the atomic force microscope

被引:13
|
作者
Good, BS [1 ]
Banerjea, A [1 ]
机构
[1] SN BOSE NATL CTR BASIC SCI,CALCUTTA 700064,W BENGAL,INDIA
关键词
D O I
10.1088/0953-8984/8/10/005
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Recent simulations of the interaction between planar surfaces and model atomic force microscope (AFM) tips have suggested that there are conditions under which the tip may become unstable and 'avalanche' toward the sample surface. Here we investigate via computer simulation the stability of a variety of model AFM tip configurations with respect to the avalanche transition for a number of fee metals. We perform Monte Carlo simulations at room temperature using the equivalent-crystal theory (ECT) of Smith and Banerjea. Results are compared with recent experimental results as well as with our earlier work on the avalanche of parallel planar surfaces. Our results on a model single-atom tip are in excellent agreement with recent experiments on tunnelling through mechanically controlled break junctions.
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页码:1325 / 1333
页数:9
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