Determination of tip-sample interaction potentials by dynamic force spectroscopy

被引：104
|
作者：
Hölscher, H
Allers, W
Schwarz, UD
Schwarz, A
Wiesendanger, R
机构：
[1] Univ Hamburg, Inst Phys Appl, D-20355 Hamburg, Germany
[2] Univ Hamburg, Microstruct Res Ctr, D-20355 Hamburg, Germany
来源：
PHYSICAL REVIEW LETTERS | 1999年 / 83卷 / 23期
关键词：
D O I：
10.1103/PhysRevLett.83.4780
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
We introduce a new method which allows the precise determination of the lip-sample interaction potentials with an atomic force microscope and avoids the so-called "jump to contact" of the tip to the sample surface. The method is based on the measurement of the resonance frequency as a function of the resonance amplitude of the oscillated cantilever. The application of this method to model potentials and to experimental data, obtained for a graphite sample and a silicon lip in ultrahigh vacuum, demonstrates its reliability.
引用
收藏
页码：4780 / 4783
页数：4
相关论文
共 50 条
  • [1] Determination of tip-sample interaction forces from measured dynamic force spectroscopy curves
    Gotsmann, B
    Anczykowski, B
    Seidel, C
    Fuchs, H
    APPLIED SURFACE SCIENCE, 1999, 140 (3-4) : 314 - 319
  • [2] Nature of tip-sample interaction in dynamic mode atomic force microscopy
    Univ of Tokyo, Tokyo, Japan
    Jpn J Appl Phys Part 1 Regul Pap Short Note Rev Pap, 12 A (7354-7557):
  • [3] Nature of tip-sample interaction in dynamic mode atomic force microscopy
    Kageshima, M
    Imayoshi, T
    Yamada, H
    Nakayama, K
    Sakama, H
    Kawazu, A
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1997, 36 (12A): : 7354 - 7357
  • [4] Direct tip-sample interaction force control for the dynamic mode atomic force microscopy
    Jeong, Younkoo
    Jayanth, G. R.
    Jhiang, Sissy M.
    Menq, Chia-Hsiang
    APPLIED PHYSICS LETTERS, 2006, 88 (20)
  • [5] Quantitative measurement of tip-sample forces by dynamic force spectroscopy in ambient conditions
    Hölscher, H
    Anczykowski, B
    SURFACE SCIENCE, 2005, 579 (01) : 21 - 26
  • [6] Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance
    Dagdeviren, Omur E.
    Schwarz, Udo D.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2019, 90 (03):
  • [7] Simulation of tip-sample interaction in the atomic force microscope
    Good, BS
    Banerjea, A
    JOURNAL OF PHYSICS-CONDENSED MATTER, 1996, 8 (10) : 1325 - 1333
  • [8] Study of tip-sample interaction in scanning force microscopy
    Luna, M
    Colchero, J
    Gómez-Herrero, J
    Baró, AM
    APPLIED SURFACE SCIENCE, 2000, 157 (04) : 285 - 289
  • [9] Quantitative analysis of tip-sample interaction in non-contact scanning force spectroscopy
    Palacios-Lidon, Elisa
    Colchero, Jaime
    NANOTECHNOLOGY, 2006, 17 (21) : 5491 - 5500
  • [10] Electrostatic tip-sample interaction in immersion force microscopy of semiconductors
    Donolato, C
    PHYSICAL REVIEW B, 1996, 54 (03): : 1478 - 1481
12345