Determination of tip-sample interaction potentials by dynamic force spectroscopy

被引：104
|
作者：
Hölscher, H
Allers, W
Schwarz, UD
Schwarz, A
Wiesendanger, R
机构：
[1] Univ Hamburg, Inst Phys Appl, D-20355 Hamburg, Germany
[2] Univ Hamburg, Microstruct Res Ctr, D-20355 Hamburg, Germany
来源：
PHYSICAL REVIEW LETTERS | 1999年 / 83卷 / 23期
关键词：
D O I：
10.1103/PhysRevLett.83.4780
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
We introduce a new method which allows the precise determination of the lip-sample interaction potentials with an atomic force microscope and avoids the so-called "jump to contact" of the tip to the sample surface. The method is based on the measurement of the resonance frequency as a function of the resonance amplitude of the oscillated cantilever. The application of this method to model potentials and to experimental data, obtained for a graphite sample and a silicon lip in ultrahigh vacuum, demonstrates its reliability.
引用
收藏
页码：4780 / 4783
页数：4
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