Grain-boundary character and grain growth in bulk tin and bulk lead-free solder alloys

被引:123
|
作者
Telang, AU [1 ]
Bieler, TR
Lucas, JP
Subramanian, KN
Lehman, LR
Xing, Y
Cotts, EJ
机构
[1] Michigan State Univ, Dept Chem Engn & Mat Sci, E Lansing, MI 48824 USA
[2] SUNY Binghamton, Binghamton, NY 13902 USA
关键词
lead-free solder; grain boundary character; OIM; grain boundary sliding; cooling rate; aging; thermal expansion;
D O I
10.1007/s11664-004-0081-2
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Grain-boundary deformation is the primary failure mode observed in solder joints. Understanding the effects of alloy composition variations and cooling rates on microstructural stability and deformation processes will allow development of improved joints. The effects of these variables on grain-boundary character were investigated in a pure-tin ingot and a reflowed sample; ingots of Sn-3.5wt.%Ag and Sn-3.8wt.%Ag-0.7wt.%Cu; and solder balls with 1.63-wt.% or 3-wt.% Ag. The microstructure was characterized using orientation imaging microscopy (OIM). After aging (150degreesC for 200 h), the fine-grained polycrystalline microstructure in both pure-tin specimens grew considerably, revealing preferred misorientations and ledge formation at grain boundaries. Aging of the alloy ingots showed only slight grain growth caused by precipitate pinning. The solder balls showed similar phenomena. The role of alloying elements, cooling rate, and the anisotropy of the coefficient of thermal expansion (CTE) in tin on microstructural evolution, grain-boundary character, and properties of solder joints are discussed.
引用
收藏
页码:1412 / 1423
页数:12
相关论文
共 50 条
  • [31] Creep resistance of tin-based lead-free solder alloys
    M. L. Huang
    C. M. L. Wu
    L. Wang
    Journal of Electronic Materials, 2005, 34 : 1373 - 1377
  • [32] STUDY ON LEAD-FREE SOLDER JOINT RELIABILITY BASED ON GRAIN ORIENTATION
    Xu Jiayu
    Chen Hongtao
    Li Mingyu
    ACTA METALLURGICA SINICA, 2012, 48 (09) : 1042 - 1048
  • [33] Effect of Grain Orientation on Electromigration Degradation in Lead-free Solder Joints
    Tian, Yanhong
    Qin, Jingkai
    He, Xiaobin
    Wang, Chunqing
    2012 13TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING (ICEPT-HDP 2012), 2012, : 1080 - 1082
  • [34] Grain-boundary segregation in binary alloys
    Smirnov, A. N.
    PHYSICS OF METALS AND METALLOGRAPHY, 2008, 106 (01): : 76 - 81
  • [35] Grain-boundary segregation in binary alloys
    A. N. Smirnov
    The Physics of Metals and Metallography, 2008, 106 : 76 - 81
  • [36] Growth of (αTi) grain-boundary layers in Ti–Co alloys
    A. S. Gornakova
    S. I. Prokofiev
    B. B. Straumal
    K. I. Kolesnikova
    Russian Journal of Non-Ferrous Metals, 2016, 57 : 703 - 709
  • [37] Temperature dependence of grain boundary structure and grain growth in bulk silicon-iron
    Choi, JS
    Yoon, DY
    ISIJ INTERNATIONAL, 2003, 43 (02) : 245 - 250
  • [38] COMPUTER-SIMULATION OF SIMULTANEOUS BULK, GRAIN-BOUNDARY, AND SURFACE-DIFFUSION
    METSCH, P
    SPIT, FHM
    BAKKER, H
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1986, 93 (02): : 543 - 547
  • [39] The status of lead-free solder alloys
    Seelig, K
    Suraski, D
    ADVANCED ELECTRONICS ASSEMBLY - A SYMPOSIUM ON LEAD FREE INTERCONNECT TECHNOLOGY, PROCEEDINGS OF THE TECHNICAL PROGRAM, 2000, : 36 - 41
  • [40] MONTE-CARLO SIMULATION OF SIMULTANEOUS BULK, GRAIN-BOUNDARY, AND SURFACE DIFFUSION
    BRANDT, WW
    JOURNAL OF CHEMICAL PHYSICS, 1973, 59 (10): : 5562 - 5570