Comprehensive modeling and characterization of Photon Detection Efficiency and Jitter in advanced SPAD devices

被引：4

作者：

Helleboid, Remi ^{[1
]}

Rideau, Denis ^{[1
]}

Nicholson, Isobel ^{[2
]}

Moussy, Norbert ^{[3
]}

Saxod, Olivier ^{[3
]}

Basset, Marie ^{[1
]}

Grebot, Jeremy ^{[1
]}

Zimmerman, Antonin ^{[1
]}

Mamdy, Bastien ^{[1
]}

Golanski, Dominique ^{[1
]}

Agnew, Megan ^{[2
]}

Pellegrini, Sara ^{[2
]}

Sicre, Mathieu ^{[1
]}

机构：

[1] STMicroelectronics, Crolles, France

[2] STMicroelectronics, Edinburgh, Midlothian, Scotland

[3] CEA LETI, Grenoble, France

来源：

IEEE 51ST EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC 2021) | 2021年

关键词：

single-photon avalanche diode (SPAD); photon detection efficiency (PDE); jitter; avalanche breakdown probability; breakdown voltage; Technology computer-aided design (TCAD);

D O I：

10.1109/ESSDERC53440.2021.9631801

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a new method to reliably simulate the PDE and jitter for realistic 3D device simulations of SPAD devices. This method is based on the use of electric field lines to mimic the carriers' trajectories, which allows the transformation of a 3D problem into a multitude of 1D problems. This idea is applied to the McIntyre model for breakdown avalanche probability to calculate PDE, but also for jitter prediction using a dedicated advection-diffusion model. The results obtained numerically are compared with an extensive series of measurements and show a good agreement on a wide variety of device designs.

引用

页码：271 / 274

页数：4

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