Comprehensive modeling and characterization of Photon Detection Efficiency and Jitter in advanced SPAD devices

被引：4

作者：

Helleboid, Remi ^{[1
]}

Rideau, Denis ^{[1
]}

Nicholson, Isobel ^{[2
]}

Moussy, Norbert ^{[3
]}

Saxod, Olivier ^{[3
]}

Basset, Marie ^{[1
]}

Grebot, Jeremy ^{[1
]}

Zimmerman, Antonin ^{[1
]}

Mamdy, Bastien ^{[1
]}

Golanski, Dominique ^{[1
]}

Agnew, Megan ^{[2
]}

Pellegrini, Sara ^{[2
]}

Sicre, Mathieu ^{[1
]}

机构：

[1] STMicroelectronics, Crolles, France

[2] STMicroelectronics, Edinburgh, Midlothian, Scotland

[3] CEA LETI, Grenoble, France

来源：

IEEE 51ST EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE (ESSDERC 2021) | 2021年

关键词：

single-photon avalanche diode (SPAD); photon detection efficiency (PDE); jitter; avalanche breakdown probability; breakdown voltage; Technology computer-aided design (TCAD);

D O I：

10.1109/ESSDERC53440.2021.9631801

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a new method to reliably simulate the PDE and jitter for realistic 3D device simulations of SPAD devices. This method is based on the use of electric field lines to mimic the carriers' trajectories, which allows the transformation of a 3D problem into a multitude of 1D problems. This idea is applied to the McIntyre model for breakdown avalanche probability to calculate PDE, but also for jitter prediction using a dedicated advection-diffusion model. The results obtained numerically are compared with an extensive series of measurements and show a good agreement on a wide variety of device designs.

引用

页码：271 / 274

页数：4

共 31 条

[1] Comprehensive Modeling and Characterization of Photon Detection Efficiency and Jitter Tail in Advanced SPAD Devices
Helleboid, Remi
Rideau, Denis
Grebot, Jeremy
Nicholson, Isobel
Moussy, Norbert
Saxod, Olivier
Basset, Marie
Zimmer, Antonin
Mamdy, Bastien
Golanski, Dominique
Agnew, Megan
Pellegrini, Sara
Sicre, Mathieu
Buj, Christel
Marchand, Guillaume
Saint-Martin, Jerome
Pala, Marco
Dollfus, Philippe
[J]. IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, 2022, 10 : 584 - 592
[2] Modeling, Simulation Methods and Characterization of Photon Detection Probability in CMOS-SPAD
Panglosse, Aymeric
Martin-Gonthier, Philippe
Marcelot, Olivier
Virmontois, Cedric
Saint-Pe, Olivier
Magnan, Pierre
[J]. SENSORS, 2021, 21 (17)
[3] Photon Detection Efficiency simulation of InGaAs/InP SPAD
Signorelli, Fabio
Telesca, Fabio
Tosi, Alberto
[J]. 2020 INTERNATIONAL CONFERENCE ON NUMERICAL SIMULATION OF OPTOELECTRONIC DEVICES (NUSOD), 2020, : 21 - 22
[4] Improvement of SPAD Photon Detection Efficiency with Diffraction Window Layer
Sun, Feiyang
Wu, Zhong
Zhu, Sihui
Xu, Yue
[J]. 2019 CHINA SEMICONDUCTOR TECHNOLOGY INTERNATIONAL CONFERENCE (CSTIC), 2019,
[5] An Estimation of Single Photon Avalanche Diode (SPAD) Photon Detection Efficiency (PDE) Nonuniformity
Savuskan, Vitali
Brouk, Igor
Javitt, Michael
Nemirovsky, Yael
[J]. IEEE SENSORS JOURNAL, 2013, 13 (05) : 1637 - 1640
[6] Optical-stack optimization for improved SPAD photon detection efficiency
Antolovic, I. Michel
Ulku, Arin C.
Kizilkan, Ekin
Lindner, Scott
Zanella, Frederic
Ferrini, Rolando
Schnieper, Marc
Charbon, Edoardo
Bruschini, Claudio
[J]. QUANTUM SENSING AND NANO ELECTRONICS AND PHOTONICS XVI, 2019, 10926
[7] Comprehensive Modeling of Advanced Composite Magnetoresistive Devices
Sverdlov, Viktor
Bendra, Mario
Pruckner, Bernhard
Fiorentini, Simone
Goes, Wolfgang
Selberherr, Siegfried
[J]. IEEE 53RD EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE, ESSDERC 2023, 2023, : 93 - 96
[8] Temperature-dependent Photon Detection Efficiency model for InGaAs/InP SPAD
Telesca, Fabio
Signorelli, Fabio
Tosi, Alberto
[J]. 2021 ANNUAL CONFERENCE OF THE IEEE PHOTONICS SOCIETY (IPC), 2021,
[9] A physically based model for evaluating the photon detection efficiency and the temporal response of SPAD detectors
Gulinatti, A.
Rech, I.
Assanelli, M.
Ghioni, M.
Cova, S.
[J]. JOURNAL OF MODERN OPTICS, 2011, 58 (3-4) : 210 - 224
[10] Design and Characterization of n/p-well CMOS SPAD With Low Dark Count Rate and High Photon Detection Efficiency
Wu, Jau Yang
Liu, Chun-Hsien
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2023, 70 (02) : 582 - 587

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