Comprehensive Modeling and Characterization of Photon Detection Efficiency and Jitter Tail in Advanced SPAD Devices

被引:4
|
作者
Helleboid, Remi [1 ,2 ,3 ]
Rideau, Denis [1 ]
Grebot, Jeremy [1 ]
Nicholson, Isobel [4 ]
Moussy, Norbert [2 ]
Saxod, Olivier [2 ]
Basset, Marie [1 ]
Zimmer, Antonin [1 ]
Mamdy, Bastien [1 ]
Golanski, Dominique [1 ]
Agnew, Megan [4 ]
Pellegrini, Sara [4 ]
Sicre, Mathieu [1 ]
Buj, Christel [1 ]
Marchand, Guillaume [1 ]
Saint-Martin, Jerome [3 ]
Pala, Marco [3 ]
Dollfus, Philippe [3 ]
机构
[1] STMicroelectronics, TDP TOS, F-38926 Crolles, France
[2] CEA LETI, F-38054 Grenoble, France
[3] Univ Paris Saclay, CNRS, Ctr Nanosci & Nanotechnol, F-91120 Palaiseau, France
[4] STMicroelectronics, IMG Div, Edinburgh EH3 5DA, Midlothian, Scotland
关键词
Single-photon avalanche diodes; Jitter; Semiconductor process modeling; Computational modeling; Solid modeling; Silicon; Photonics; Avalanche breakdown probability; breakdown voltage; jitter; photon detection efficiency (PDE); single-photon avalanche diode (SPAD); technology computer-aided design (TCAD); AVALANCHE-DIODE; TECHNOLOGY;
D O I
10.1109/JEDS.2022.3168365
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new method to reliably simulate the PDE and jitter tail for realistic three-dimensional SPAD devices is presented. The simulation method is based on the use of electric field lines to mimic the carriers' trajectories, and on one-dimensional models for avalanche breakdown probability and charges transport. This approach allows treating a three-dimensional problem as several one-dimensional problems along each field line. The original approach is applied to the McIntyre model for avalanche breakdown probability to calculate PDE, but also for jitter prediction using a dedicated advection-diffusion model. The results obtained numerically are compared with an extensive series of measurements and show a good agreement on a wide variety of device designs.
引用
收藏
页码:584 / 592
页数:9
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