共 50 条
- [1] PHOTORESIST PARTICLE CONTROL FOR VLSI MICROLITHOGRAPHY [J]. SOLID STATE TECHNOLOGY, 1984, 27 (03) : 159 - 161
- [2] Monitoring and control of photoresist properties and CD during photoresist processing [J]. METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXIV, 2010, 7638
- [3] Control of photoresist thickness uniformity in the microlithography process [J]. IECON'03: THE 29TH ANNUAL CONFERENCE OF THE IEEE INDUSTRIAL ELECTRONICS SOCIETY, VOLS 1 - 3, PROCEEDINGS, 2003, : 2091 - 2096
- [5] Control of spatial and transient temperature trajectories for photoresist processing [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1999, 17 (05): : 2109 - 2114
- [8] Real-time estimation and control of photoresist properties in microlithography [J]. PROCEEDINGS OF THE 2007 IEEE CONFERENCE ON CONTROL APPLICATIONS, VOLS 1-3, 2007, : 278 - 283
- [9] PROCESSING LATITUDE IN PHOTORESIST PATTERNING [J]. SOLID STATE TECHNOLOGY, 1980, 23 (01) : 76 - 80