Control and signal processing for photoresist processing in microlithography

被引:0
|
作者
Tay, A [1 ]
Ho, WK [1 ]
Lim, KW [1 ]
Loh, AP [1 ]
Tan, WW [1 ]
机构
[1] Natl Univ Singapore, Dept Elect & Comp Engn, S-119260 Singapore, Singapore
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The lithography process is a critical step in the fabrication of nanostructures for integrated circuit manufacturing. In this paper, a summary is presented of several projects applying control and signal processing techniques to lithography. We begin with a presentation of a non-optical lithography process under development in our lab. The proposed lithography technique is based on chemically altering the surface in a spatially selective manner to achieve a patterned substrate. In addition to the exposure step, photoresist processing is also critical in lithography. Based on current limitations of photoresist thermal processing system, a new integrated system is designed to improve the performance of temperature sensitive chemically amplified photoresists used in deep-UV lithography. Two case studies where control and signal processing techniques have made an impact in photoresist processing are also presented.
引用
收藏
页码:1468 / 1473
页数:6
相关论文
共 50 条
  • [1] PHOTORESIST PARTICLE CONTROL FOR VLSI MICROLITHOGRAPHY
    LONG, ML
    [J]. SOLID STATE TECHNOLOGY, 1984, 27 (03) : 159 - 161
  • [2] Monitoring and control of photoresist properties and CD during photoresist processing
    Yang, Geng
    Ngo, Yit-Sung
    Putra, Andi S.
    Ang, Kar-Tien
    Tay, Arthur
    Fang, Zhong-Ping
    [J]. METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXIV, 2010, 7638
  • [3] Control of photoresist thickness uniformity in the microlithography process
    Tay, A
    [J]. IECON'03: THE 29TH ANNUAL CONFERENCE OF THE IEEE INDUSTRIAL ELECTRONICS SOCIETY, VOLS 1 - 3, PROCEEDINGS, 2003, : 2091 - 2096
  • [4] PHOTORESIST SYSTEMS FOR MICROLITHOGRAPHY
    VOLLENBROEK, FA
    SPIERTZ, EJ
    [J]. ADVANCES IN POLYMER SCIENCE, 1988, 84 : 85 - 111
  • [5] Control of spatial and transient temperature trajectories for photoresist processing
    El-Awady, K
    Schaper, CD
    Kailath, T
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1999, 17 (05): : 2109 - 2114
  • [7] Modeling and Real-Time Control of Multizone Thermal Processing System for Photoresist Processing
    Tay, Arthur
    Chua, Hui Tong
    Wang Yuheng
    Yang Geng
    Khuen, Ho Weng
    [J]. INDUSTRIAL & ENGINEERING CHEMISTRY RESEARCH, 2013, 52 (13) : 4805 - 4814
  • [8] Real-time estimation and control of photoresist properties in microlithography
    Wu, Xiaodong
    Tay, Arthur
    Ho, Weng Khuen
    Tan, Kok Kiong
    [J]. PROCEEDINGS OF THE 2007 IEEE CONFERENCE ON CONTROL APPLICATIONS, VOLS 1-3, 2007, : 278 - 283
  • [9] PROCESSING LATITUDE IN PHOTORESIST PATTERNING
    DECKERT, CA
    PETERS, DA
    [J]. SOLID STATE TECHNOLOGY, 1980, 23 (01) : 76 - 80
  • [10] OUTGAS FREE PHOTORESIST PROCESSING
    ONODERA, M
    NONAKA, T
    HORIKOSHI, M
    OHMI, T
    YOKOTA, A
    NITTA, T
    [J]. SOLID STATE TECHNOLOGY, 1991, 34 (02) : S7 - S10