Control and signal processing for photoresist processing in microlithography

被引:0
|
作者
Tay, A [1 ]
Ho, WK [1 ]
Lim, KW [1 ]
Loh, AP [1 ]
Tan, WW [1 ]
机构
[1] Natl Univ Singapore, Dept Elect & Comp Engn, S-119260 Singapore, Singapore
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The lithography process is a critical step in the fabrication of nanostructures for integrated circuit manufacturing. In this paper, a summary is presented of several projects applying control and signal processing techniques to lithography. We begin with a presentation of a non-optical lithography process under development in our lab. The proposed lithography technique is based on chemically altering the surface in a spatially selective manner to achieve a patterned substrate. In addition to the exposure step, photoresist processing is also critical in lithography. Based on current limitations of photoresist thermal processing system, a new integrated system is designed to improve the performance of temperature sensitive chemically amplified photoresists used in deep-UV lithography. Two case studies where control and signal processing techniques have made an impact in photoresist processing are also presented.
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页码:1468 / 1473
页数:6
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