Fabrication of X-ray mirror for hard X-ray diffraction limited nanofocusing

被引:0
|
作者
Yumoto, Hirokatsu [1 ]
Mimura, Hidekazu [1 ]
Matsuyama, Satoshi [1 ]
Handa, Soichiro [1 ]
Shibatani, Akihiko [1 ]
Katagishi, Keiko [1 ]
Yamamura, Kazuya [1 ]
Sano, Yasuhisa [1 ]
Endo, Katsuyoshi [1 ]
Mori, Yuzo [1 ]
Yabashi, Makina [2 ]
Nishino, Yoshinori [3 ]
Tamasaku, Kenji [3 ]
Ishikawa, Tetsuya [3 ]
Yamauchi, Kazuto [1 ]
机构
[1] Osaka Univ, Grad Sch Engn, 2-1 Yamadaoka, Suita, Osaka 5650871, Japan
[2] JASRI, Spring 8, Sayo, Hyogo 6795198, Japan
[3] RIKEN, Spring 8, Sayo, Hyogo 6795198, Japan
关键词
nanofocusing; at-wavelength metrology; x-ray mirror; multilayer; and phase error correction;
D O I
暂无
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We designed, fabricated and evaluated a total-reflection mirror having a designed focal size of 28 mu at 15keV. Line-focus tests on the fabricated mirror were carried out at the 1-km-long beamline (BL29XUL) of SPring-8. Nearly diffraction-limited performance with a full width at half maximum spot size of 30 nm was realized at 15 keV. We are planning to fabricate multilayer-coated mirror for realizing sub-10-nm focusing in hard x-ray region. We suggest a novel method of at-wavelength metrology. Wave-front error on the mirror surface can be estimated by a phase retrieval method using the intensity profile around the focal point. By correcting the estimated wave-front errors, sub-10-nm focusing is potentially feasible.
引用
收藏
页码:967 / +
页数:2
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