Structural refinement of the ternary chalcogenide compound Cu2GeTe3 by X-ray powder diffraction

被引：41
|
作者：
Delgado, GE [1 ]
Mora, AJ
Pirela, M
Velásquez-Velásquez, A
Villarreal, M
Fernández, BJ
机构：
[1] Univ Los Andes, Fac Ciencias, Dept Quim, Lab Cristalog, Merida 5101, Venezuela
[2] Univ Los Andes, Fac Ciencias, Dept Fis, Ctr Estudios Semicond,Lab Temp Bajas, Merida 5101, Venezuela
来源：
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2004年 / 201卷 / 13期
关键词：
D O I：
10.1002/pssa.200406850
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The Cu2GeTe3 compound crystallizes in the Imm2 (Ndegrees44) space group, Z = 2, with a = 12.641(l) A, b = 4.2115 (2) Angstrom, c = 5.9261(2) Angstrom, V = 315.49(3) Angstrom(3). Its structure was refined from X-ray powder diffraction data using the Rietveld method. The refinement of 23 instrumental and structural variables led to RP = 8.2%, R-wp p = 11.6%, R-exp = 6.8%, R-B = 11.2 % and S = 1.7, for 5501 step intensities and 253 independent reflections. This compound is isostructural with Cu2GeSe3, and consists of a three-dimensional arrangement of slightly distorted CuTe4 and GeTe4 tetrahedra connected by common corners. (C) 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
引用
收藏
页码：2900 / 2904
页数：5
相关论文
共 50 条
  • [41] Structural refinement of X-ray diffraction profile for artificial superlattices
    Ishibashi, Y
    Ohashi, N
    Tsurumi, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (01): : 186 - 191
  • [42] Structural analysis of perovskite LaCr1-xNixO3 by Rietveld refinement of X-ray powder diffraction data
    Yang, J.
    ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 2008, 64 : 281 - 286
  • [43] Structural refinement of artificial superlattices by the X-ray diffraction method
    Ishibashi, Y
    Ohashi, N
    Tsurumi, T
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 1999, 35 : S96 - S99
  • [44] X-ray powder diffraction data and structural parameters for Re compound NdCo0.6Sb2
    Zeng, LM
    Wu, SW
    Qin, W
    Zhang, LP
    Yan, JL
    Hao, JM
    Nong, LQ
    TRANSACTIONS OF NONFERROUS METALS SOCIETY OF CHINA, 1997, 7 (02) : 60 - 62
  • [45] Structural refinement of Eu doped CaMgSi2O6 using X-ray powder diffraction data
    Kim, YI
    Nahm, SH
    Bin Im, W
    Jeon, DY
    Gregory, DH
    JOURNAL OF LUMINESCENCE, 2005, 115 (1-2) : 1 - 6
  • [46] Rietveld refinement of the semiconducting system Bi2-xFexTe3 from X-ray powder diffraction
    Adam, Alia
    MATERIALS RESEARCH BULLETIN, 2007, 42 (12) : 1986 - 1994
  • [47] Structural instability of EuTiO3 from X-ray powder diffraction
    Koehler, J.
    Dinnebier, R.
    Bussmann-Holder, A.
    PHASE TRANSITIONS, 2012, 85 (11) : 949 - 955
  • [48] Reliability of the structural data for calcite and dolomite extracted from X-ray powder diffraction by Rietveld refinement
    Liu, Shanke
    Li, He
    Liu, Jianming
    PERIODICO DI MINERALOGIA, 2014, 83 (01): : 121 - 140
  • [49] Fe3W3N: A Rietveld refinement using X-ray powder diffraction
    Weil, Kenneth S.
    Kumta, Prashant N.
    Acta Crystallographica, Section C: Crystal Structure Communications, 1997, 53 (pt 12): : 1745 - 1748
  • [50] Fe3W3N:: a Rietveld refinement using x-ray powder diffraction
    Weil, KS
    Kumta, PN
    ACTA CRYSTALLOGRAPHICA SECTION C-CRYSTAL STRUCTURE COMMUNICATIONS, 1997, 53 : 1745 - 1748
12345