Structural refinement of Eu doped CaMgSi2O6 using X-ray powder diffraction data

被引:10
|
作者
Kim, YI [1 ]
Nahm, SH
Bin Im, W
Jeon, DY
Gregory, DH
机构
[1] Univ Nottingham, Sch Chem, Nottingham NG7 2RD, England
[2] Korea Res Inst Stand & Sci, Div Chem Metrol Evaluat, Taejon 305600, South Korea
[3] Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Taejon 305701, South Korea
关键词
blue emission; plasma display panel; photoluminescence; X-ray crystallography;
D O I
10.1016/j.jlumin.2005.02.006
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Blue-color emitting material, CaMgSi2O6:EU2+ (CMS:Eu2+), was synthesized by a normal solid state reaction using CaCO3, MgO, SiO2 and EuF3 as starting materials. The Rietveld method was employed to quantitatively determine the structural parameters of synthesized CMS:Eu2+. The structural parameters for CMS:Eu2+ were successfully determined by Rietveld refinement using X-ray powder diffraction data. The final weighted R-factor, Rw,, was 9.22% and the goodness-of-fit indicator, S(= R-wp/R-e), was 1.45. The synthesized sample consisted of CMS:Eu2+ and SiO2 (cristobalite) phases with refined phase fractions of 89.18(1)% and 10.82(2)%, respectively. Doped EU2+ ions occupied the Ca sites (4e) and replaced 1.0% of the Ca2+ ions. The refined model of CMS:Eu2 + describes a structure in monoclinic space group C 2/c with Z = 4, a = 9.7474(2)angstrom, b = 8.9384(2) angstrom, c = 5.2490(1) angstrom and beta = 105.87 (1)degrees. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:1 / 6
页数:6
相关论文
共 50 条
  • [1] Combined Rietveld refinement of CaMgSi2O6:Eu2+ using X-ray and neutron powder diffraction data
    Yong-Il Kim
    Won Bin Im
    Duk Young Jeon
    [J]. Journal of Materials Science, 2006, 41 : 1643 - 1647
  • [2] Combined Rietveld refinement of CaMgSi2O6:Eu2+ using X-ray and neutron powder diffraction data
    Kim, YI
    Im, WB
    Jeon, DY
    [J]. JOURNAL OF MATERIALS SCIENCE, 2006, 41 (05) : 1643 - 1647
  • [3] Structural refinement of BaMgAl10O17:: Eu2+ using X-ray and neutron powder diffraction
    Kim, YI
    Kang, SO
    Lee, JS
    Jung, MJ
    Kim, KH
    [J]. JOURNAL OF MATERIALS SCIENCE LETTERS, 2002, 21 (03) : 219 - 222
  • [4] VUV spectral properties of CaMgSi2O6 : Eu
    Key Laboratory of Luminescence and Optical Information, Institute of Optoelectronic Technology, Beijing Jiaotong University, Beijing 100044, China
    [J]. Guang Pu Xue Yu Guang Pu Fen Xi, 2007, 5 (978-981):
  • [5] Structural refinement of nano BaTiO3 powder using X-ray diffraction data
    Yong-Il Kim
    Seung-Hoon Nahm
    Maeng-Joon Jung
    [J]. Journal of Materials Science, 2004, 39 : 4363 - 4366
  • [6] Structural refinement of nano BaTiO3 powder using X-ray diffraction data
    Kim, YI
    Nahm, SH
    Jung, MJ
    [J]. JOURNAL OF MATERIALS SCIENCE, 2004, 39 (13) : 4363 - 4366
  • [7] VUV spectral properties of CaMgSi2O6:Eu
    Zhou Dan
    He Da-wei
    Hou Tao
    [J]. SPECTROSCOPY AND SPECTRAL ANALYSIS, 2007, 27 (05) : 978 - 981
  • [8] Combined Rietveld refinement of BaMgAl10O17:Eu2+ using X-ray and neutron powder diffraction data
    Kim, YI
    Kim, KB
    Jung, MJ
    Hong, JS
    [J]. JOURNAL OF LUMINESCENCE, 2002, 99 (02) : 91 - 100
  • [9] Emission controlled dual emitting Eu-doped CaMgSi2O6 nanophosphors
    Pawar, Amol
    Jadhav, Abhijit
    Kim, Chang Woo
    Cha, Hyun Gil
    Pal, Umapada
    Kang, Young Soo
    [J]. JOURNAL OF LUMINESCENCE, 2015, 157 : 131 - 136
  • [10] Structural study of annealed BaMgAl10O17:Eu2+ using X-ray powder diffraction data
    Kim, YI
    Moon, SC
    Kang, SO
    Jung, MJ
    Hong, JS
    [J]. JOURNAL OF MATERIALS SCIENCE LETTERS, 2003, 22 (09) : 669 - 673