Combined Rietveld refinement of CaMgSi2O6:Eu2+ using X-ray and neutron powder diffraction data

被引：0
|
作者：
Yong-Il Kim
Won Bin Im
Duk Young Jeon
机构：
[1] Korea Research Institute of Standards and Science,Department of Materials Science and Engineering
[2] Korea Advanced Institute of Science and Technology,undefined
来源：
Journal of Materials Science | 2006年 / 41卷
关键词：
Polymer; Powder Diffraction; Diffraction Data; Rietveld Refinement; Powder Diffraction Data;
D O I：
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中图分类号：
学科分类号：
摘要：
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页码：1643 / 1647
页数：4
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