Structural refinement of the ternary chalcogenide compound Cu2GeTe3 by X-ray powder diffraction

被引：41
|
作者：
Delgado, GE [1 ]
Mora, AJ
Pirela, M
Velásquez-Velásquez, A
Villarreal, M
Fernández, BJ
机构：
[1] Univ Los Andes, Fac Ciencias, Dept Quim, Lab Cristalog, Merida 5101, Venezuela
[2] Univ Los Andes, Fac Ciencias, Dept Fis, Ctr Estudios Semicond,Lab Temp Bajas, Merida 5101, Venezuela
来源：
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2004年 / 201卷 / 13期
关键词：
D O I：
10.1002/pssa.200406850
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The Cu2GeTe3 compound crystallizes in the Imm2 (Ndegrees44) space group, Z = 2, with a = 12.641(l) A, b = 4.2115 (2) Angstrom, c = 5.9261(2) Angstrom, V = 315.49(3) Angstrom(3). Its structure was refined from X-ray powder diffraction data using the Rietveld method. The refinement of 23 instrumental and structural variables led to RP = 8.2%, R-wp p = 11.6%, R-exp = 6.8%, R-B = 11.2 % and S = 1.7, for 5501 step intensities and 253 independent reflections. This compound is isostructural with Cu2GeSe3, and consists of a three-dimensional arrangement of slightly distorted CuTe4 and GeTe4 tetrahedra connected by common corners. (C) 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
引用
收藏
页码：2900 / 2904
页数：5
相关论文
共 50 条
  • [1] Crystal structure refinement of the ternary compound Cu2SnTe3 by X-ray powder diffraction
    Delgado, G. E.
    Mora, A. J.
    Marcano, G.
    Rincon, C.
    CRYSTAL RESEARCH AND TECHNOLOGY, 2008, 43 (04) : 433 - 437
  • [2] The X-ray powder diffraction data and crystal structure of Al2Cu3Dy ternary compound
    Li, D. G.
    Liang, L. Q.
    Liu, S. H.
    Qin, M.
    He, B.
    Qin, C. S.
    Li, C. B.
    Huang, Y. Z.
    Zeng, L. M.
    ADVANCES IN ENGINEERING MATERIALS AND APPLIED MECHANICS, 2016, : 543 - 546
  • [3] X-ray powder diffraction refinement of Cu2ZnGeTe4 structure and phase diagram of the Cu2GeTe3-ZnTe system
    Parasyuk, OV
    Olekseyuk, ID
    Piskach, LV
    JOURNAL OF ALLOYS AND COMPOUNDS, 2005, 397 (1-2) : 169 - 172
  • [4] X-ray powder diffraction refinement of Cu2ZnGeTe4 structure and phase diagram of the Cu2GeTe3-ZnTe system
    Parasyuk, O.V. (oleg@lab.univer.lutsk.ua), 1600, Elsevier Ltd (397): : 1 - 2
  • [5] Crystal structure refinement of the semiconducting compound Cu2SnSe3 from X-ray powder diffraction data
    Delgado, GE
    Mora, AJ
    Marcano, G
    Rincón, C
    MATERIALS RESEARCH BULLETIN, 2003, 38 (15) : 1949 - 1955
  • [6] Structure Refinement of the Semiconducting Compound Cu3TaS4 from X-Ray Powder Diffraction Data
    Delgado, G. E.
    Contreras, J. E.
    Mora, A. J.
    Duran, S.
    Munoz, M.
    Grima-Gallardo, P.
    ACTA PHYSICA POLONICA A, 2011, 120 (03) : 468 - 472
  • [7] X-ray powder diffraction data for the Al3Ho2Si2 ternary compound
    Lu, Zhao
    Qin, Ming
    Liang, Liuqing
    Liu, Shuhui
    Huang, Caiming
    Qing, Peiling
    Zeng, Lingmin
    POWDER DIFFRACTION, 2013, 28 (04) : 299 - 301
  • [8] Synthesis and characterization of the ternary compounds Cu2GeSe3 and Cu2GeTe3
    Villarreal, MA
    Fernández, BJ
    Pirela, M
    Velásquez-Velásquez, A
    Mora, AJ
    Delgado, GE
    REVISTA MEXICANA DE FISICA, 2003, 49 : 198 - 200
  • [9] X-ray powder diffraction data and structure refinement of compound ErNi2Si2
    Yan, JL
    Ou, XL
    Zeng, LM
    TRANSACTIONS OF NONFERROUS METALS SOCIETY OF CHINA, 1998, 8 (04) : 622 - 625
  • [10] X-RAY POWDER DIFFRACTION DATA AND STRUCTURE REFINEMENT OF COMPOUND ErNi2Si2
    Yan Jialin
    TransactionsofNonferrousMetalsSocietyofChina, 1998, (04) : 91 - 94
12345