X-ray powder diffraction refinement of Cu2ZnGeTe4 structure and phase diagram of the Cu2GeTe3-ZnTe system

被引：17

作者：

Parasyuk, OV ^{[1
]}

Olekseyuk, ID ^{[1
]}

Piskach, LV ^{[1
]}

机构：

[1] Volyn State Univ, Dept Gen & Inorgan Chem, Lutsk, Ukraine

来源：

JOURNAL OF ALLOYS AND COMPOUNDS | 2005年 / 397卷 / 1-2期

关键词：

phase diagram; crystal structure; X-ray diffraction; semiconductors;

D O I：

10.1016/j.jallcom.2005.01.032

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The phase diagram of the Cu2GeTe3-ZnTe system was investigated using differential thermal analysis and X-ray diffraction. A Cu2ZnGeTe4 compound forms in the system that melts incongruently at 823 K. Its crystal structure was refined using powder X-ray diffraction. Cu2ZnGeTe4 crystallizes in the tetragonal space group 1 (4) over bar 2m (structure type Cu2FeSnS4) with lattice constants a = 0.59540(4) nm, c = 1.1848(l) nm, c/a = 1.990. The atomic parameters were refined in the isotropic approximation to R-I = 0.0786. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：169 / 172

页数：4

共 50 条

[1] X-ray powder diffraction refinement of Cu2ZnGeTe4 structure and phase diagram of the Cu2GeTe3-ZnTe system
Parasyuk, O.V. (oleg@lab.univer.lutsk.ua), 1600, Elsevier Ltd (397): : 1 - 2
[2] Structural refinement of the ternary chalcogenide compound Cu2GeTe3 by X-ray powder diffraction
Delgado, GE
Mora, AJ
Pirela, M
Velásquez-Velásquez, A
Villarreal, M
Fernández, BJ
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2004, 201 (13): : 2900 - 2904
[3] Crystal structure refinement of the ternary compound Cu2SnTe3 by X-ray powder diffraction
Delgado, G. E.
Mora, A. J.
Marcano, G.
Rincon, C.
CRYSTAL RESEARCH AND TECHNOLOGY, 2008, 43 (04) : 433 - 437
[4] X-ray powder diffraction refinement of Ag2In2SiSe6 structure and phase diagram of the AgInSe2-SiSe2 system
Olekseyuk, ID
Sachanyuk, VP
Parasyuk, OV
JOURNAL OF ALLOYS AND COMPOUNDS, 2006, 414 (1-2) : 73 - 77
[5] X-ray powder diffraction refinement of Ag2In2SiSe6 structure and phase diagram of the AgInSe2-SiSe2 system
Olekseyuk, I.D.
Sachanyuk, V.P.
Parasyuk, O.V.
Journal of Alloys and Compounds, 2006, 414 (1-2): : 73 - 77
[6] Crystal structure refinement of the semiconducting compound Cu2SnSe3 from X-ray powder diffraction data
Delgado, GE
Mora, AJ
Marcano, G
Rincón, C
MATERIALS RESEARCH BULLETIN, 2003, 38 (15) : 1949 - 1955
[7] Structure Refinement of the Semiconducting Compound Cu3TaS4 from X-Ray Powder Diffraction Data
Delgado, G. E.
Contreras, J. E.
Mora, A. J.
Duran, S.
Munoz, M.
Grima-Gallardo, P.
ACTA PHYSICA POLONICA A, 2011, 120 (03) : 468 - 472
[8] Synchrotron X-ray Powder Diffraction and Electronic Band Structure of α- and β-Cu2ZnSiS4
Rosmus, Kimberly A.
Brunetta, Carl D.
Srnec, Matthew N.
Karuppannan, Balamurugan
Aitken, Jennifer A.
ZEITSCHRIFT FUR ANORGANISCHE UND ALLGEMEINE CHEMIE, 2012, 638 (15): : 2578 - 2584
[9] X-RAY POWDER DIFFRACTION STUDY FOR THE Cu2Cd1-zFezSnSe4 ALLOY SYSTEM
Henao, J. A.
Macias, M. A.
Quintero, M.
Moreno, E.
Morocoima, M.
Quintero, E.
Grima, P.
Tovar, R.
Bocaranda, P.
CHALCOGENIDE LETTERS, 2009, 6 (11): : 583 - 593
[10] X-ray powder diffraction data and structural characterization of Cu2GeS3 and Cu2SnS3
de Chalbaud, LM
Delgado, JM
Sagredo, V
TERNARY AND MULTINARY COMPOUNDS, 1998, 152 : 151 - 154

← 1 2 3 4 5 →