Magnetic resonance force microscopy studies in a thin permalloy film

被引：6
|
作者：
Nazaretski, E.
Thompson, J. D.
Pelekhov, D. V.
Mewes, T.
Wigen, P. E.
Kim, J.
Zalalutdinov, M.
Baldwin, J. W.
Houston, B.
Hammel, P. C.
Movshovich, R.
机构：
[1] Los Alamos Natl Lab, Los Alamos, NM 87545 USA
[2] Ohio State Univ, Dept Phys, Columbus, OH 43210 USA
[3] Univ Alabama, Dept Phys & Astron, Tuscaloosa, AL 35487 USA
[4] SFA Inc, Crofton, MD 21114 USA
[5] USN, Res Lab, Washington, DC 20375 USA
来源：
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 2007年 / 310卷 / 02期
关键词：
magnetic films; magnetic resonance force microscopy; temperature dependence; ferromagnetic resonance;
D O I：
10.1016/j.jmmm.2006.10.994
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A 50 nm thick Permalloy film has been studied using magnetic resonance force microscopy (MRFM). The ferromagnetic resonance signal has been mechanically detected utilizing a cantilever with a Nd2Fe14B tip. The measurements were performed in the temperature range between 10 and 70 K and a DC field applied perpendicular to the surface of the. lm. The microwave field was in the plane. The measurements indicate a decrease of the ferromagnetic resonance field with increasing temperature which may be attributed to temperature-dependent changes of the saturation magnetization. The measurements demonstrate the capability of MRFM to study temperature-dependent phenomena. (C) 2006 Elsevier B. V. All rights reserved.
引用
收藏
页码：E941 / E943
页数：3
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