Temperature-dependent magnetic resonance force microscopy studies of a thin Permalloy film

被引：13
|
作者：
Nazaretski, E.
Thompson, J. D.
Movshovich, R.
Zalalutdinov, M.
Baldwin, J. W.
Houston, B.
Mewes, T.
Pelekhov, D. V.
Wigen, P.
Hammel, P. C.
机构：
[1] Los Alamos Natl Lab, Los Alamos, NM 87545 USA
[2] SFA Inc, Crofton, MD 21114 USA
[3] USN, Res Lab, Washington, DC 20375 USA
[4] Univ Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA
[5] Univ Alabama, Dept Phys & Astron, Tuscaloosa, AL 35487 USA
[6] Ohio State Univ, Dept Phys, Columbus, OH 43210 USA
来源：
JOURNAL OF APPLIED PHYSICS | 2007年 / 101卷 / 07期
关键词：
D O I：
10.1063/1.2715761
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We used magnetic resonance force microscopy (MRFM) to study a 50 nm thick continuous Permalloy film. We mechanically measured the ferromagnetic resonance signal in the temperature range between 10 and 70 K in the presence of a static magnetic field applied normal to the surface of the film. The measurements show a decrease of the ferromagnetic resonance field with increasing temperature. We attribute this behavior to the temperature-dependent changes of the saturation magnetization. Our experiments demonstrate the potential of MRFM to perform quantitative ferromagnetic resonance measurements as a function of temperature. (c) 2007 American Institute of Physics.
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页数：4
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