X-Ray Refraction Computer-Tomography.

被引：0
|
作者：
Hentschel, MP
Lange, A
Müller, BR
Schors, J
Harbich, KW
机构：
来源：
MATERIALPRUFUNG | 2000年 / 42卷 / 06期
关键词：
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
New Techniques of X-Ray Refraction Computer-Tomography provide tools for non-destructive imaging of inner surfaces and interfaces of heterogeneous materials. Line scans of X-ray small angle scattering intensities of samples are collected under 360 inclination angles. Section views are reconstructed by Fourier filtered back projection. Applications to polymer and ceramic composites reveal their inner interface and surface structure independently from density variations.
引用
收藏
页码：217 / 221
页数：5
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