X-Ray Refraction Computer-Tomography.

被引：0
|
作者：
Hentschel, MP
Lange, A
Müller, BR
Schors, J
Harbich, KW
机构：
来源：
MATERIALPRUFUNG | 2000年 / 42卷 / 06期
关键词：
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
New Techniques of X-Ray Refraction Computer-Tomography provide tools for non-destructive imaging of inner surfaces and interfaces of heterogeneous materials. Line scans of X-ray small angle scattering intensities of samples are collected under 360 inclination angles. Section views are reconstructed by Fourier filtered back projection. Applications to polymer and ceramic composites reveal their inner interface and surface structure independently from density variations.
引用
收藏
页码：217 / 221
页数：5
相关论文
共 50 条
  • [21] Measuring wood density by means of X-ray computer tomography
    Freyburger, Charline
    Longuetaud, Fleur
    Mothe, Frederic
    Constant, Thiery
    Leban, Jean-Michel
    ANNALS OF FOREST SCIENCE, 2009, 66 (08) : 804p1 - 804p9
  • [22] Investigation of IC samples using X-ray computer tomography
    Bord, S
    Clement, A
    Lecomte, JC
    Marmeggi, JC
    JOURNAL DE PHYSIQUE IV, 2004, 118 : 413 - 417
  • [23] μ-X-ray computer axial tomography application in life sciences
    Tiseanu, I
    Craciunescu, T
    Mandache, NB
    Duliu, OG
    JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2005, 7 (02): : 1073 - 1078
  • [24] Application of X-ray computer tomography (CT) in cattle production
    Hollo, G.
    Szucs, E.
    Tozser, J.
    Hollo, I.
    Repa, I.
    ASIAN-AUSTRALASIAN JOURNAL OF ANIMAL SCIENCES, 2007, 20 (12): : 1901 - 1908
  • [25] Bragg magnifier:: A detector for submicrometer x-ray computer tomography
    Stampanoni, M
    Borchert, G
    Abela, R
    Rüegsegger, P
    JOURNAL OF APPLIED PHYSICS, 2002, 92 (12) : 7630 - 7635
  • [26] INVESTIGATION OF CDTE DETECTORS DESIGNED FOR COMPUTER X-RAY TOMOGRAPHY
    KARPENKO, VP
    MATVEEV, OA
    SEMICONDUCTORS, 1993, 27 (11-12) : 1048 - 1050
  • [27] PRINCIPLES OF IMAGE-RECONSTRUCTION IN X-RAY COMPUTER TOMOGRAPHY
    SCHWIERZ, G
    HARER, W
    RUHRNSCHOPF, EP
    SIEMENS FORSCHUNGS-UND ENTWICKLUNGSBERICHTE-SIEMENS RESEARCH AND DEVELOPMENT REPORTS, 1978, 7 (04): : 196 - 203
  • [28] REFRACTION CONTRAST IN THE X-RAY INTROSCOPY
    SOMENKOV, VA
    TKALICH, AK
    SHILSHTEIN, SS
    ZHURNAL TEKHNICHESKOI FIZIKI, 1991, 61 (11): : 197 - 201
  • [29] X-ray refraction of paper and pigments
    Hentschel, Manfred P., 1600, Carl Hanser Verlag GmbH & Co, Munich, Germany (37):
  • [30] Refraction contrast in X-ray imaging
    Keyriläinen, J
    Fernández, M
    Suortti, P
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2002, 488 (1-2): : 419 - 427
12345