Structure and dynamics of thin polymer films using synchrotron X-ray scattering

被引：2

作者：

Jiang, Zhang

Kim, Hyunjung

Lee, Heeju

Lee, Young Joo

Jiao, Xuesong

Li, Chunhua

Lurio, Laurence B.

Hu, Xuesong

Lal, Jyotsana

Narayanan, Suresh

Sandy, Alec

Rafailovich, Miriam

Sinha, Sunil K. ^{[1
]}

机构：

[1] Univ Calif San Diego, Dept Phys, La Jolla, CA 92093 USA

[2] Sogang Univ, Dept Phys, Seoul 121742, South Korea

[3] Sogang Univ, Interdisciplinary Program Integrated Biotechnol, Seoul 121742, South Korea

[4] No Illinois Univ, Dept Phys, De Kalb, IL 60115 USA

[5] SUNY Stony Brook, Dept Mat Sci & Engn, Stony Brook, NY 11794 USA

[6] Argonne Natl Lab, Intense Pulsed Neutron Source, Argonne, IL 60439 USA

[7] Adv Photon Source, Argonne, IL 60439 USA

[8] Los Alamos Natl Lab, LANSCE, Los Alamos, NM 87545 USA

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2007年 / 40卷

关键词：

GLASS-TRANSITION TEMPERATURE; REPTATION; INTERFACE; SURFACES;

D O I：

10.1107/S0021889807007996

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Recent measurements of the scattering function and of the dynamics of surface and interfacial fluctuations in thin supported molten films and bilayers using synchrotron X-ray diffuse scattering and photon correlation spectroscopy in reflection geometry are reported. The results for monolayer films thicker than four times of the radius of gyration of polystyrene show behavior of normal over-damped capillary waves expected for the surface fluctuations of a viscous liquid. However, thinner films show deviations indicating the need to account for viscoelasticity. The theory has been extended to the surface and interfacial modes in a bilayer film system. The results are discussed in terms of surface tension, viscosity and shear modulus. Also recent experiments to measure the isothermal compressibility of supported polystyrene films by studying 'bulk' scattering from the interior of the films is discussed.

引用

页码：S18 / S22

页数：5

共 50 条

[21] Measurement of applied strains in thin films deposited onto polymer by synchrotron X-ray diffraction
Renault, P. O.
Djaziri, S.
Le Bourhis, E.
Goudeau, Ph
Faurie, D.
Thiaudiere, D.
Hild, F.
11TH INTERNATIONAL CONFERENCE ON THE MECHANICAL BEHAVIOR OF MATERIALS (ICM11), 2011, 10
[22] In situ synchrotron X-ray studies of ferroelectric thin films
Fong, DD
Eastman, JA
Stephenson, GB
Fuoss, PH
Streiffer, SK
Thompson, C
Auciello, O
JOURNAL OF SYNCHROTRON RADIATION, 2005, 12 : 163 - 167
[23] In situ synchrotron X-ray studies of ferroelectric thin films
Fong, Dillon D.
Thompson, Carol
ANNUAL REVIEW OF MATERIALS RESEARCH, 2006, 36 : 431 - 465
[24] Investigation of phase miscibility of CoCrPt thin films using anomalous x-ray scattering and extended x-ray absorption fine structure
Sun, CJ
Chow, GM
Han, SW
Wang, JP
Hwu, YK
Je, JH
APPLIED PHYSICS LETTERS, 2006, 88 (12)
[25] Structure and dynamics of polymer nanocomposites studied by X-ray and neutron scattering techniques
Genix, Anne-Caroline
Oberdisse, Julian
CURRENT OPINION IN COLLOID & INTERFACE SCIENCE, 2015, 20 (04) : 293 - 303
[26] X-ray diffuse scattering investigation of thin films
Logothetidis, S
Panayiotatos, Y
Gravalidis, C
Patsalas, P
Zoy, A
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2003, 102 (1-3): : 25 - 29
[27] X-ray scattering from thin films and multilayers
Rafaja, D
EUROPEAN POWDER DIFFRACTION EPDIC 8, 2004, 443-4 : 65 - 70
[28] Polymer film dynamics with coherent x-ray scattering
Kim, HJ
Rühm, A
Lurio, LB
Basu, JK
Lal, J
Mochrie, SGJ
Sinha, SK
SLOW DYNAMICS IN COMPLEX SYSTEMS, 2004, 708 : 213 - 216
[29] CHARACTERIZATION OF POLYPHENYLENE THIN-FILMS USING SYNCHROTRON RADIATION X-RAY REFLECTIVITY
ROBERTS, KJ
SHERWOOD, JN
SHRIPATHI, T
OLDMAN, RJ
HOLMES, PA
NEVIN, A
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1990, 23 (02) : 255 - 257
[30] Synchrotron X-ray magnetic scattering
Stirling, WG
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2003, 199 : 295 - 300

← 1 2 3 4 5 →